从液He温度测量中估计小结的电容

1998 Conference on Precision Electromagnetic Measurements Digest (Cat. No.98CH36254) Pub Date : 1998-07-06 DOI:10.1109/CPEM.1998.699874

A. Iwasa, A. Fukushima, A. Sato, Y. Sakamoto

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引用次数: 2

摘要

我们展示了利用I-V曲线的高温膨胀，从4.2 K测量中估计小结的电容C和隧道电阻R/sub T/的方法。它使我们能够及时反馈来制造单电子隧穿元件。

本文章由计算机程序翻译，如有差异，请以英文原文为准。

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Estimation of capacitance of small junction from liquid He temperature measurement

We show the way to estimate capacitance C and tunnel resistance R/sub T/ of a small junction from 4.2 K measurements using high temperature expansion for I-V curve. It enables us prompt feedback to fabricate the single electron tunneling elements.

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来源期刊

1998 Conference on Precision Electromagnetic Measurements Digest (Cat. No.98CH36254)

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