{"title":"量子阱到量子点隧穿的解析模型","authors":"R. Clerc, G. Ghibaudo, G. Pananakakis","doi":"10.1109/ESSDERC.2003.1256913","DOIUrl":null,"url":null,"abstract":"This paper presents an analytical model of elastic tunneling from a quantum well to a quantum dot, applicable to the modeling of single electron transistor and memory charging. The main differences between tunneling to a quantum dot and to a continuum of states have been carefully addressed. The impact of quantum decoherence factors such as temperature and dot size dispersion have also been investigated.","PeriodicalId":350452,"journal":{"name":"ESSDERC '03. 33rd Conference on European Solid-State Device Research, 2003.","volume":"75 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2003-09-16","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"2","resultStr":"{\"title\":\"Analytical model for quantum well to quantum dot tunneling\",\"authors\":\"R. Clerc, G. Ghibaudo, G. Pananakakis\",\"doi\":\"10.1109/ESSDERC.2003.1256913\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"This paper presents an analytical model of elastic tunneling from a quantum well to a quantum dot, applicable to the modeling of single electron transistor and memory charging. The main differences between tunneling to a quantum dot and to a continuum of states have been carefully addressed. The impact of quantum decoherence factors such as temperature and dot size dispersion have also been investigated.\",\"PeriodicalId\":350452,\"journal\":{\"name\":\"ESSDERC '03. 33rd Conference on European Solid-State Device Research, 2003.\",\"volume\":\"75 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2003-09-16\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"2\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"ESSDERC '03. 33rd Conference on European Solid-State Device Research, 2003.\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/ESSDERC.2003.1256913\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"ESSDERC '03. 33rd Conference on European Solid-State Device Research, 2003.","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/ESSDERC.2003.1256913","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
Analytical model for quantum well to quantum dot tunneling
This paper presents an analytical model of elastic tunneling from a quantum well to a quantum dot, applicable to the modeling of single electron transistor and memory charging. The main differences between tunneling to a quantum dot and to a continuum of states have been carefully addressed. The impact of quantum decoherence factors such as temperature and dot size dispersion have also been investigated.