{"title":"SMT铁氧体磁珠的SPICE仿真建模","authors":"C. Rostamzadeh, F. Grassi, F. Kashefi","doi":"10.1109/ISEMC.2011.6038369","DOIUrl":null,"url":null,"abstract":"A practical approach for lumped-parameter circuit modeling of SMT ferrite beads is introduced. Vector Network Analyzer (VNA) measurements are utilized to provide the frequency-dependent characteristics for SPICE analysis. The measured data is imported into the simulation environment via Analog Behavioral Models (ABM) accounting for the frequency-dependent behavior of the ferrite sheets. It demonstrates a significant departure from a simple R-L-C circuit network. Model accuracy is validated by realization of an ad hoc test-board and by experimental characterization of the component in terms of Insertion Loss.","PeriodicalId":440959,"journal":{"name":"2011 IEEE International Symposium on Electromagnetic Compatibility","volume":"20 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2011-10-10","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"11","resultStr":"{\"title\":\"Modeling SMT ferrite beads for SPICE simulation\",\"authors\":\"C. Rostamzadeh, F. Grassi, F. Kashefi\",\"doi\":\"10.1109/ISEMC.2011.6038369\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"A practical approach for lumped-parameter circuit modeling of SMT ferrite beads is introduced. Vector Network Analyzer (VNA) measurements are utilized to provide the frequency-dependent characteristics for SPICE analysis. The measured data is imported into the simulation environment via Analog Behavioral Models (ABM) accounting for the frequency-dependent behavior of the ferrite sheets. It demonstrates a significant departure from a simple R-L-C circuit network. Model accuracy is validated by realization of an ad hoc test-board and by experimental characterization of the component in terms of Insertion Loss.\",\"PeriodicalId\":440959,\"journal\":{\"name\":\"2011 IEEE International Symposium on Electromagnetic Compatibility\",\"volume\":\"20 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2011-10-10\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"11\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"2011 IEEE International Symposium on Electromagnetic Compatibility\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/ISEMC.2011.6038369\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"2011 IEEE International Symposium on Electromagnetic Compatibility","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/ISEMC.2011.6038369","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
A practical approach for lumped-parameter circuit modeling of SMT ferrite beads is introduced. Vector Network Analyzer (VNA) measurements are utilized to provide the frequency-dependent characteristics for SPICE analysis. The measured data is imported into the simulation environment via Analog Behavioral Models (ABM) accounting for the frequency-dependent behavior of the ferrite sheets. It demonstrates a significant departure from a simple R-L-C circuit network. Model accuracy is validated by realization of an ad hoc test-board and by experimental characterization of the component in terms of Insertion Loss.
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