{"title":"自动化电磁干扰测量与数据处理集成平台","authors":"Shih-Yi Yuan, Po-Wei Huang, Chia-Hung Su","doi":"10.1109/EMCCompo.2019.8919917","DOIUrl":null,"url":null,"abstract":"This paper develops a measurement platform that controls the detailed measurement process in response to information leakage measurement requirements, mainly through the integration of a robot arm and the measurement instruments to achieve the goal of automated measurement. The measurement result is EMI distribution on the transient current of a test circuit board. This method is used for the acquisition of complex EMI data for machine learning algorithms, and the data is obtained through a large amount of comprehensive information.","PeriodicalId":252700,"journal":{"name":"2019 12th International Workshop on the Electromagnetic Compatibility of Integrated Circuits (EMC Compo)","volume":"44 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2019-10-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"2","resultStr":"{\"title\":\"Automated EMI measurement and data processing integration platform\",\"authors\":\"Shih-Yi Yuan, Po-Wei Huang, Chia-Hung Su\",\"doi\":\"10.1109/EMCCompo.2019.8919917\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"This paper develops a measurement platform that controls the detailed measurement process in response to information leakage measurement requirements, mainly through the integration of a robot arm and the measurement instruments to achieve the goal of automated measurement. The measurement result is EMI distribution on the transient current of a test circuit board. This method is used for the acquisition of complex EMI data for machine learning algorithms, and the data is obtained through a large amount of comprehensive information.\",\"PeriodicalId\":252700,\"journal\":{\"name\":\"2019 12th International Workshop on the Electromagnetic Compatibility of Integrated Circuits (EMC Compo)\",\"volume\":\"44 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2019-10-01\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"2\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"2019 12th International Workshop on the Electromagnetic Compatibility of Integrated Circuits (EMC Compo)\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/EMCCompo.2019.8919917\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"2019 12th International Workshop on the Electromagnetic Compatibility of Integrated Circuits (EMC Compo)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/EMCCompo.2019.8919917","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
Automated EMI measurement and data processing integration platform
This paper develops a measurement platform that controls the detailed measurement process in response to information leakage measurement requirements, mainly through the integration of a robot arm and the measurement instruments to achieve the goal of automated measurement. The measurement result is EMI distribution on the transient current of a test circuit board. This method is used for the acquisition of complex EMI data for machine learning algorithms, and the data is obtained through a large amount of comprehensive information.