高斯过程回归提高自供电发生时间传感器性能

Liang Zhou, K. Aono, S. Chakrabartty
{"title":"高斯过程回归提高自供电发生时间传感器性能","authors":"Liang Zhou, K. Aono, S. Chakrabartty","doi":"10.1109/MWSCAS.2018.8624046","DOIUrl":null,"url":null,"abstract":"In our previous work, we had demonstrated a CMOS timer-injector integrated circuit for self-powered sensing of time-of-occurrence of mechanical events. While the sensor could achieve an improved time-stamping accuracy by averaging the output across over multiple channels, the mismatch between the channels made the calibration process cumbersome and time-consuming. In this paper, we propose the use of non-parametric machine learning techniques to achieve more robust and accurate event reconstruction. This is demonstrated using training and testing data that were obtained from fabricated prototypes on a $0.5-\\mu \\mathrm {m}$ CMOS process; the model trained using Gaussian process regression can achieve an average recovery accuracy of 3.3% on testing data, which is comparable to the performance of using an averaging technique on calibrated injection results. The experimental results also validate that scalable performance can be achieved by employing more injection channels.","PeriodicalId":365263,"journal":{"name":"2018 IEEE 61st International Midwest Symposium on Circuits and Systems (MWSCAS)","volume":"14 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2018-08-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"1","resultStr":"{\"title\":\"Gaussian Process Regression for Improving the Performance of Self-powered Time-of-Occurrence Sensors\",\"authors\":\"Liang Zhou, K. Aono, S. Chakrabartty\",\"doi\":\"10.1109/MWSCAS.2018.8624046\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"In our previous work, we had demonstrated a CMOS timer-injector integrated circuit for self-powered sensing of time-of-occurrence of mechanical events. While the sensor could achieve an improved time-stamping accuracy by averaging the output across over multiple channels, the mismatch between the channels made the calibration process cumbersome and time-consuming. In this paper, we propose the use of non-parametric machine learning techniques to achieve more robust and accurate event reconstruction. This is demonstrated using training and testing data that were obtained from fabricated prototypes on a $0.5-\\\\mu \\\\mathrm {m}$ CMOS process; the model trained using Gaussian process regression can achieve an average recovery accuracy of 3.3% on testing data, which is comparable to the performance of using an averaging technique on calibrated injection results. The experimental results also validate that scalable performance can be achieved by employing more injection channels.\",\"PeriodicalId\":365263,\"journal\":{\"name\":\"2018 IEEE 61st International Midwest Symposium on Circuits and Systems (MWSCAS)\",\"volume\":\"14 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2018-08-01\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"1\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"2018 IEEE 61st International Midwest Symposium on Circuits and Systems (MWSCAS)\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/MWSCAS.2018.8624046\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"2018 IEEE 61st International Midwest Symposium on Circuits and Systems (MWSCAS)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/MWSCAS.2018.8624046","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 1

摘要

在我们之前的工作中,我们展示了一个CMOS定时器注入集成电路,用于自供电感应机械事件的发生时间。虽然传感器可以通过在多个通道上平均输出来提高时间戳精度,但通道之间的不匹配使得校准过程繁琐且耗时。在本文中,我们提出使用非参数机器学习技术来实现更鲁棒和准确的事件重建。这是通过在$0.5-\mu \ mathm {m}$ CMOS工艺上从制造原型中获得的训练和测试数据来证明的;使用高斯过程回归训练的模型可以在测试数据上实现3.3%的平均恢复精度,这与使用校准注入结果的平均技术的性能相当。实验结果还验证了采用更多注入通道可以实现可扩展性能。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
Gaussian Process Regression for Improving the Performance of Self-powered Time-of-Occurrence Sensors
In our previous work, we had demonstrated a CMOS timer-injector integrated circuit for self-powered sensing of time-of-occurrence of mechanical events. While the sensor could achieve an improved time-stamping accuracy by averaging the output across over multiple channels, the mismatch between the channels made the calibration process cumbersome and time-consuming. In this paper, we propose the use of non-parametric machine learning techniques to achieve more robust and accurate event reconstruction. This is demonstrated using training and testing data that were obtained from fabricated prototypes on a $0.5-\mu \mathrm {m}$ CMOS process; the model trained using Gaussian process regression can achieve an average recovery accuracy of 3.3% on testing data, which is comparable to the performance of using an averaging technique on calibrated injection results. The experimental results also validate that scalable performance can be achieved by employing more injection channels.
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