Marco T. Kassis, D. Tannir, Raffi Toukhtarian, R. Khazaka
{"title":"基于力矩的线性和非线性电路元件x参数灵敏度分析","authors":"Marco T. Kassis, D. Tannir, Raffi Toukhtarian, R. Khazaka","doi":"10.1109/EPEPS47316.2019.193208","DOIUrl":null,"url":null,"abstract":"The X-parameters of a nonlinear structure or circuit block relate the different harmonics of the incident power waves to the reflected ones in the frequency domain. Recently, a moments based approach for the computation of the X-parameters sensitivity has been developed. In this manuscript, we build on those results and present an efficient and accurate moments based method for the sensitivity analysis with respect to both linear and nonlinear circuit parameters. The proposed method allows for the accurate and efficient computation of X-parameter sensitivity without the need for brute force perturbation.","PeriodicalId":304228,"journal":{"name":"2019 IEEE 28th Conference on Electrical Performance of Electronic Packaging and Systems (EPEPS)","volume":"52 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2019-10-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"4","resultStr":"{\"title\":\"Moments-Based Sensitivity Analysis of X-Parameters with respect to Linear and Nonlinear Circuit Components\",\"authors\":\"Marco T. Kassis, D. Tannir, Raffi Toukhtarian, R. Khazaka\",\"doi\":\"10.1109/EPEPS47316.2019.193208\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"The X-parameters of a nonlinear structure or circuit block relate the different harmonics of the incident power waves to the reflected ones in the frequency domain. Recently, a moments based approach for the computation of the X-parameters sensitivity has been developed. In this manuscript, we build on those results and present an efficient and accurate moments based method for the sensitivity analysis with respect to both linear and nonlinear circuit parameters. The proposed method allows for the accurate and efficient computation of X-parameter sensitivity without the need for brute force perturbation.\",\"PeriodicalId\":304228,\"journal\":{\"name\":\"2019 IEEE 28th Conference on Electrical Performance of Electronic Packaging and Systems (EPEPS)\",\"volume\":\"52 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2019-10-01\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"4\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"2019 IEEE 28th Conference on Electrical Performance of Electronic Packaging and Systems (EPEPS)\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/EPEPS47316.2019.193208\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"2019 IEEE 28th Conference on Electrical Performance of Electronic Packaging and Systems (EPEPS)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/EPEPS47316.2019.193208","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
Moments-Based Sensitivity Analysis of X-Parameters with respect to Linear and Nonlinear Circuit Components
The X-parameters of a nonlinear structure or circuit block relate the different harmonics of the incident power waves to the reflected ones in the frequency domain. Recently, a moments based approach for the computation of the X-parameters sensitivity has been developed. In this manuscript, we build on those results and present an efficient and accurate moments based method for the sensitivity analysis with respect to both linear and nonlinear circuit parameters. The proposed method allows for the accurate and efficient computation of X-parameter sensitivity without the need for brute force perturbation.