通过增加额外输入来设计延迟可验证的组合逻辑

X. Yu, Y. Min
{"title":"通过增加额外输入来设计延迟可验证的组合逻辑","authors":"X. Yu, Y. Min","doi":"10.1109/ATS.1997.643979","DOIUrl":null,"url":null,"abstract":"Correct operation of logic circuits requires not only the functional correctness, but also the correctness of temporal behavior. This paper deals with the problem of delay testability of two-level circuits through adding extra inputs. A design of delay-verifiable combinational logic by adding extra inputs is proposed, and a synthesis procedure is given. Experimental results show that the hardware overhead is about 1/3 of that of the methods proposed previously (1987, 1991), which aim at robust testable or VNR testable circuits. In fact, it is good enough to guarantee delay verifiability to satisfy the requirement of temporal correctness.","PeriodicalId":330767,"journal":{"name":"Proceedings Sixth Asian Test Symposium (ATS'97)","volume":"14 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"1997-11-17","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":"{\"title\":\"Design of delay-verifiable combinational logic by adding extra inputs\",\"authors\":\"X. Yu, Y. Min\",\"doi\":\"10.1109/ATS.1997.643979\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"Correct operation of logic circuits requires not only the functional correctness, but also the correctness of temporal behavior. This paper deals with the problem of delay testability of two-level circuits through adding extra inputs. A design of delay-verifiable combinational logic by adding extra inputs is proposed, and a synthesis procedure is given. Experimental results show that the hardware overhead is about 1/3 of that of the methods proposed previously (1987, 1991), which aim at robust testable or VNR testable circuits. In fact, it is good enough to guarantee delay verifiability to satisfy the requirement of temporal correctness.\",\"PeriodicalId\":330767,\"journal\":{\"name\":\"Proceedings Sixth Asian Test Symposium (ATS'97)\",\"volume\":\"14 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"1997-11-17\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"0\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"Proceedings Sixth Asian Test Symposium (ATS'97)\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/ATS.1997.643979\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"Proceedings Sixth Asian Test Symposium (ATS'97)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/ATS.1997.643979","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 0

摘要

逻辑电路的正确运行不仅要求功能的正确性,而且要求时间行为的正确性。通过增加额外输入,研究了双电平电路的延时可测性问题。提出了一种增加额外输入的延迟可验证组合逻辑的设计方法,并给出了合成步骤。实验结果表明,该方法的硬件开销约为先前提出的方法(1987年,1991年)的1/3,主要针对鲁棒可测试电路或VNR可测试电路。实际上,保证延迟可验证性就足以满足时间正确性的要求。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
Design of delay-verifiable combinational logic by adding extra inputs
Correct operation of logic circuits requires not only the functional correctness, but also the correctness of temporal behavior. This paper deals with the problem of delay testability of two-level circuits through adding extra inputs. A design of delay-verifiable combinational logic by adding extra inputs is proposed, and a synthesis procedure is given. Experimental results show that the hardware overhead is about 1/3 of that of the methods proposed previously (1987, 1991), which aim at robust testable or VNR testable circuits. In fact, it is good enough to guarantee delay verifiability to satisfy the requirement of temporal correctness.
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