可信测试基础结构的综合方法

2019 IEEE 4th International Verification and Security Workshop (IVSW) Pub Date : 2019-07-01 DOI:10.1109/IVSW.2019.8854428

Marc Merandat, Vincent Reynaud, E. Valea, J. Quévremont, Nicolas Valette, P. Maistri, R. Leveugle, M. Flottes, Sophie Dupuis, B. Rouzeyre, G. D. Natale

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引用次数: 3

摘要

电子设备的可测试性是至关重要的，它通常由IEEE标准支持。另一方面，如果没有采取适当的对策，可用的方法可能成为恶意攻击者的入口点。在本文中，我们报告了HADES项目的最新结果，提出了一个安全测试基础设施的解决方案组合。

本文章由计算机程序翻译，如有差异，请以英文原文为准。

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A Comprehensive Approach to a Trusted Test Infrastructure

The testability of electronic devices is of critical importance and it is often supported by IEEE standards. The available methods, on the other hand, can be an entry point to a malicious attacker, if no proper countermeasure is adopted. In this paper, we report the latest results from the HADES project, presenting a portfolio of solution towards a secure test infrastructure.

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2019 IEEE 4th International Verification and Security Workshop (IVSW)

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