RELAB:在SPICE模拟器中包含mosfet BTI和可变性的工具

2012 International Conference on Synthesis, Modeling, Analysis and Simulation Methods and Applications to Circuit Design (SMACD) Pub Date : 2012-10-25 DOI:10.1109/SMACD.2012.6339386

J. Martín-Martínez, N. Ayala, R. Rodríguez, M. Nafría, X. Aymerich

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引用次数: 7

摘要

RELAB是一种基于不同退化现象物理模型的新型电路可靠性评估仿真工具。在这项工作中，介绍了SPICE模拟器中包含偏置温度不稳定性(BTI)及其变异性的RELAB功能。

本文章由计算机程序翻译，如有差异，请以英文原文为准。

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RELAB: A tool to include MOSFETs BTI and variability in SPICE simulators

RELAB is a new simulation tool for circuit reliability evaluation, based on the physical models of different degradation phenomena. In this work, the RELAB capabilities to include Bias Temperature Instability (BTI) and its variability in SPICE simulators is presented.

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2012 International Conference on Synthesis, Modeling, Analysis and Simulation Methods and Applications to Circuit Design (SMACD)

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