{"title":"双栅TFET与异质介电双栅TFET的比较分析","authors":"S. Sahu, S. K. Mohapatra, R. Goswami","doi":"10.1109/AESPC44649.2018.9033293","DOIUrl":null,"url":null,"abstract":"This paper compares and analyzes the performance of Hetero Dielectric Double Gate TFET (HD-DG TFET) with that of conventional DG-TFET using TCAD simulation. This paper reports the influence of various hetero dielectric materials and source doping concentrations on drain current. A low leakage current (IOFF) is observed with an improved on current and a better subthreshold swing for HD-DG TFET.","PeriodicalId":222759,"journal":{"name":"2018 International Conference on Applied Electromagnetics, Signal Processing and Communication (AESPC)","volume":"17 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2018-10-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"3","resultStr":"{\"title\":\"Comparative Analysis of Double Gate TFET and Hetero Dielectric Double Gate TFET\",\"authors\":\"S. Sahu, S. K. Mohapatra, R. Goswami\",\"doi\":\"10.1109/AESPC44649.2018.9033293\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"This paper compares and analyzes the performance of Hetero Dielectric Double Gate TFET (HD-DG TFET) with that of conventional DG-TFET using TCAD simulation. This paper reports the influence of various hetero dielectric materials and source doping concentrations on drain current. A low leakage current (IOFF) is observed with an improved on current and a better subthreshold swing for HD-DG TFET.\",\"PeriodicalId\":222759,\"journal\":{\"name\":\"2018 International Conference on Applied Electromagnetics, Signal Processing and Communication (AESPC)\",\"volume\":\"17 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2018-10-01\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"3\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"2018 International Conference on Applied Electromagnetics, Signal Processing and Communication (AESPC)\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/AESPC44649.2018.9033293\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"2018 International Conference on Applied Electromagnetics, Signal Processing and Communication (AESPC)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/AESPC44649.2018.9033293","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
Comparative Analysis of Double Gate TFET and Hetero Dielectric Double Gate TFET
This paper compares and analyzes the performance of Hetero Dielectric Double Gate TFET (HD-DG TFET) with that of conventional DG-TFET using TCAD simulation. This paper reports the influence of various hetero dielectric materials and source doping concentrations on drain current. A low leakage current (IOFF) is observed with an improved on current and a better subthreshold swing for HD-DG TFET.