{"title":"从误码率测量中提取抖动参数","authors":"M. Aleksic","doi":"10.1109/EPEPS.2011.6100187","DOIUrl":null,"url":null,"abstract":"This paper presents a method for jitter parameter extraction from bit error rate measurements, that can be used as an alternative to the dual-Dirac method. The method offers more accurate estimates of random and deterministic jitter, at the expense of a slight increase in complexity. The model underlying the method can be used for extrapolation of bit error rate to the values that are impractical to measure.","PeriodicalId":313560,"journal":{"name":"2011 IEEE 20th Conference on Electrical Performance of Electronic Packaging and Systems","volume":"79 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2011-12-12","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"4","resultStr":"{\"title\":\"Extraction of jitter parameters from BER measurements\",\"authors\":\"M. Aleksic\",\"doi\":\"10.1109/EPEPS.2011.6100187\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"This paper presents a method for jitter parameter extraction from bit error rate measurements, that can be used as an alternative to the dual-Dirac method. The method offers more accurate estimates of random and deterministic jitter, at the expense of a slight increase in complexity. The model underlying the method can be used for extrapolation of bit error rate to the values that are impractical to measure.\",\"PeriodicalId\":313560,\"journal\":{\"name\":\"2011 IEEE 20th Conference on Electrical Performance of Electronic Packaging and Systems\",\"volume\":\"79 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2011-12-12\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"4\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"2011 IEEE 20th Conference on Electrical Performance of Electronic Packaging and Systems\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/EPEPS.2011.6100187\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"2011 IEEE 20th Conference on Electrical Performance of Electronic Packaging and Systems","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/EPEPS.2011.6100187","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
Extraction of jitter parameters from BER measurements
This paper presents a method for jitter parameter extraction from bit error rate measurements, that can be used as an alternative to the dual-Dirac method. The method offers more accurate estimates of random and deterministic jitter, at the expense of a slight increase in complexity. The model underlying the method can be used for extrapolation of bit error rate to the values that are impractical to measure.