{"title":"利用数学规范和分析计算评估IEMI的干扰潜力","authors":"S. Korte, H. Garbe","doi":"10.1109/EMCEUROPE.2008.4786915","DOIUrl":null,"url":null,"abstract":"This document shows a new method for estimating the perturbation thresholds of electronic circuits while exposed by an electromagnetic field. The method is based on a simplified calculation of the coupled-in waveforms. It is compared to a former proposed estimation approach based on mathematical norms. Both investigated techniques are compared to measurements of real electronic systems.","PeriodicalId":133902,"journal":{"name":"2008 International Symposium on Electromagnetic Compatibility - EMC Europe","volume":"69 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2008-09-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"5","resultStr":"{\"title\":\"Evaluation of the disturbing potential of IEMI using mathematical norms and analytical calculations\",\"authors\":\"S. Korte, H. Garbe\",\"doi\":\"10.1109/EMCEUROPE.2008.4786915\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"This document shows a new method for estimating the perturbation thresholds of electronic circuits while exposed by an electromagnetic field. The method is based on a simplified calculation of the coupled-in waveforms. It is compared to a former proposed estimation approach based on mathematical norms. Both investigated techniques are compared to measurements of real electronic systems.\",\"PeriodicalId\":133902,\"journal\":{\"name\":\"2008 International Symposium on Electromagnetic Compatibility - EMC Europe\",\"volume\":\"69 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2008-09-01\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"5\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"2008 International Symposium on Electromagnetic Compatibility - EMC Europe\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/EMCEUROPE.2008.4786915\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"2008 International Symposium on Electromagnetic Compatibility - EMC Europe","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/EMCEUROPE.2008.4786915","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
Evaluation of the disturbing potential of IEMI using mathematical norms and analytical calculations
This document shows a new method for estimating the perturbation thresholds of electronic circuits while exposed by an electromagnetic field. The method is based on a simplified calculation of the coupled-in waveforms. It is compared to a former proposed estimation approach based on mathematical norms. Both investigated techniques are compared to measurements of real electronic systems.
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