{"title":"电场对纳米sio /sub - x/和低密度聚乙烯复合材料慢极化的影响","authors":"Zhe Li, Y. Yin, Xiaobing Dong","doi":"10.1109/ELINSL.2006.1665358","DOIUrl":null,"url":null,"abstract":"The composite of nano-SiOx and low-density polyethylene is prepared with the double-solution method. Charging currents of the composite at different dc stress, as well as discharging currents, are recorded with Keithley 6517A. It is found that the curves of charging and discharging currents increase with electrical field. Transferring those charging and discharging currents from time domain into frequency domain with Fourier Transform method, it is found that the shapes of the dielectric loss spectrum vary with electrical field. At the same time, it is also found that the dielectric loss peaks increase with electrical field in frequency domain. It is believed that these phenomena have close relation with traps of the interfaces between nano-SiOx and polyethylene, as well as carriers trapping and de-trapping in those interfaces","PeriodicalId":427638,"journal":{"name":"Conference Record of the 2006 IEEE International Symposium on Electrical Insulation","volume":"173 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2006-06-11","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"3","resultStr":"{\"title\":\"The effect of electrical field on the slow polarization of nano-SiO/sub x/ and low-density polyethylene composite\",\"authors\":\"Zhe Li, Y. Yin, Xiaobing Dong\",\"doi\":\"10.1109/ELINSL.2006.1665358\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"The composite of nano-SiOx and low-density polyethylene is prepared with the double-solution method. Charging currents of the composite at different dc stress, as well as discharging currents, are recorded with Keithley 6517A. It is found that the curves of charging and discharging currents increase with electrical field. Transferring those charging and discharging currents from time domain into frequency domain with Fourier Transform method, it is found that the shapes of the dielectric loss spectrum vary with electrical field. At the same time, it is also found that the dielectric loss peaks increase with electrical field in frequency domain. It is believed that these phenomena have close relation with traps of the interfaces between nano-SiOx and polyethylene, as well as carriers trapping and de-trapping in those interfaces\",\"PeriodicalId\":427638,\"journal\":{\"name\":\"Conference Record of the 2006 IEEE International Symposium on Electrical Insulation\",\"volume\":\"173 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2006-06-11\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"3\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"Conference Record of the 2006 IEEE International Symposium on Electrical Insulation\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/ELINSL.2006.1665358\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"Conference Record of the 2006 IEEE International Symposium on Electrical Insulation","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/ELINSL.2006.1665358","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
The effect of electrical field on the slow polarization of nano-SiO/sub x/ and low-density polyethylene composite
The composite of nano-SiOx and low-density polyethylene is prepared with the double-solution method. Charging currents of the composite at different dc stress, as well as discharging currents, are recorded with Keithley 6517A. It is found that the curves of charging and discharging currents increase with electrical field. Transferring those charging and discharging currents from time domain into frequency domain with Fourier Transform method, it is found that the shapes of the dielectric loss spectrum vary with electrical field. At the same time, it is also found that the dielectric loss peaks increase with electrical field in frequency domain. It is believed that these phenomena have close relation with traps of the interfaces between nano-SiOx and polyethylene, as well as carriers trapping and de-trapping in those interfaces