{"title":"超高速封装和互连设计的制造意义","authors":"W.M. Beckenbaugh","doi":"10.1109/EEMTS.1988.75967","DOIUrl":null,"url":null,"abstract":"Ultra-high-speed and high-lead-count IC packaging places stringent requirements on the assembly materials and processes, interconnection technology, and physical design of products. The factory automation, testing, and information transfer requirements are also significantly increased. The impact of these requirements on interconnect media fabrication tolerances and assembly methods is discussed.<<ETX>>","PeriodicalId":137899,"journal":{"name":"Fourth IEEE/CHMT European International Electronic Manufacturing Technology Symposium","volume":"7 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"1988-06-13","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"3","resultStr":"{\"title\":\"Manufacturing implications of ultrahigh speed packaging and interconnect design\",\"authors\":\"W.M. Beckenbaugh\",\"doi\":\"10.1109/EEMTS.1988.75967\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"Ultra-high-speed and high-lead-count IC packaging places stringent requirements on the assembly materials and processes, interconnection technology, and physical design of products. The factory automation, testing, and information transfer requirements are also significantly increased. The impact of these requirements on interconnect media fabrication tolerances and assembly methods is discussed.<<ETX>>\",\"PeriodicalId\":137899,\"journal\":{\"name\":\"Fourth IEEE/CHMT European International Electronic Manufacturing Technology Symposium\",\"volume\":\"7 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"1988-06-13\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"3\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"Fourth IEEE/CHMT European International Electronic Manufacturing Technology Symposium\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/EEMTS.1988.75967\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"Fourth IEEE/CHMT European International Electronic Manufacturing Technology Symposium","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/EEMTS.1988.75967","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
Manufacturing implications of ultrahigh speed packaging and interconnect design
Ultra-high-speed and high-lead-count IC packaging places stringent requirements on the assembly materials and processes, interconnection technology, and physical design of products. The factory automation, testing, and information transfer requirements are also significantly increased. The impact of these requirements on interconnect media fabrication tolerances and assembly methods is discussed.<>