4个月800k随机逻辑门:基于“IDEFIX”ASIC经验的设计方法探讨

S. Gastaldello, G. Traverso, R. Kase
{"title":"4个月800k随机逻辑门:基于“IDEFIX”ASIC经验的设计方法探讨","authors":"S. Gastaldello, G. Traverso, R. Kase","doi":"10.1109/ASIC.1998.722894","DOIUrl":null,"url":null,"abstract":"Reusability of basic building blocks is an important and effective goal in ASIC design: it speeds up the design, it minimizes the overall bug probability, it eases documentation and maintenance of core functions. Nevertheless, this approach means also a \"black box\" management, requiring some extra efforts in the implementation phase. Alcatel and Toshiba proved a solution to cope with the lack of knowledge and control of re-used blocks. This methodology seems to be effective, especially for million gates designs in deep submicron technologies. This paper discusses a real ASIC design case, where classical issues were combined: tough schedule; large glue logic (800 K netlist gates), with high connectivity; many clock domains (65 clocks), with many interactions; 50% reuse of old building blocks, many from netlist. The proposed flow improves by shortening design time, achieving high synthesis efficiency without usage of time consuming CRWC methodology, achieving high layout efficiency bypassing time consuming (and sometimes misleading) floorplanning /hierarchical methodologies.","PeriodicalId":104431,"journal":{"name":"Proceedings Eleventh Annual IEEE International ASIC Conference (Cat. No.98TH8372)","volume":"21 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"1998-09-13","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":"{\"title\":\"800 K gates of random logic in four months: discussion on design methodologies based on \\\"IDEFIX\\\" ASIC experience\",\"authors\":\"S. Gastaldello, G. Traverso, R. Kase\",\"doi\":\"10.1109/ASIC.1998.722894\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"Reusability of basic building blocks is an important and effective goal in ASIC design: it speeds up the design, it minimizes the overall bug probability, it eases documentation and maintenance of core functions. Nevertheless, this approach means also a \\\"black box\\\" management, requiring some extra efforts in the implementation phase. Alcatel and Toshiba proved a solution to cope with the lack of knowledge and control of re-used blocks. This methodology seems to be effective, especially for million gates designs in deep submicron technologies. This paper discusses a real ASIC design case, where classical issues were combined: tough schedule; large glue logic (800 K netlist gates), with high connectivity; many clock domains (65 clocks), with many interactions; 50% reuse of old building blocks, many from netlist. The proposed flow improves by shortening design time, achieving high synthesis efficiency without usage of time consuming CRWC methodology, achieving high layout efficiency bypassing time consuming (and sometimes misleading) floorplanning /hierarchical methodologies.\",\"PeriodicalId\":104431,\"journal\":{\"name\":\"Proceedings Eleventh Annual IEEE International ASIC Conference (Cat. No.98TH8372)\",\"volume\":\"21 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"1998-09-13\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"0\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"Proceedings Eleventh Annual IEEE International ASIC Conference (Cat. No.98TH8372)\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/ASIC.1998.722894\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"Proceedings Eleventh Annual IEEE International ASIC Conference (Cat. No.98TH8372)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/ASIC.1998.722894","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 0

摘要

基本构建块的可重用性是ASIC设计中一个重要而有效的目标:它加快了设计速度,最大限度地减少了总体错误概率,简化了核心功能的文档和维护。然而,这种方法也意味着一个“黑盒”管理,在实现阶段需要一些额外的努力。事实证明,阿尔卡特(Alcatel)和东芝(Toshiba)是一种解决方案,可以解决对再利用模块缺乏了解和控制的问题。这种方法似乎是有效的,特别是在深亚微米技术的百万栅极设计。本文讨论了一个真实的ASIC设计案例,其中结合了经典问题:严格的进度;大胶逻辑(800k网表门),连接性高;许多时钟域(65个时钟),有许多相互作用;50%重用旧的构建模块,许多来自netlist。提出的流程通过缩短设计时间、实现高合成效率而不使用耗时的CRWC方法、实现高布局效率而绕过耗时(有时会误导)的平面图/分层方法来改进。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
800 K gates of random logic in four months: discussion on design methodologies based on "IDEFIX" ASIC experience
Reusability of basic building blocks is an important and effective goal in ASIC design: it speeds up the design, it minimizes the overall bug probability, it eases documentation and maintenance of core functions. Nevertheless, this approach means also a "black box" management, requiring some extra efforts in the implementation phase. Alcatel and Toshiba proved a solution to cope with the lack of knowledge and control of re-used blocks. This methodology seems to be effective, especially for million gates designs in deep submicron technologies. This paper discusses a real ASIC design case, where classical issues were combined: tough schedule; large glue logic (800 K netlist gates), with high connectivity; many clock domains (65 clocks), with many interactions; 50% reuse of old building blocks, many from netlist. The proposed flow improves by shortening design time, achieving high synthesis efficiency without usage of time consuming CRWC methodology, achieving high layout efficiency bypassing time consuming (and sometimes misleading) floorplanning /hierarchical methodologies.
求助全文
通过发布文献求助,成功后即可免费获取论文全文。 去求助
来源期刊
自引率
0.00%
发文量
0
×
引用
GB/T 7714-2015
复制
MLA
复制
APA
复制
导出至
BibTeX EndNote RefMan NoteFirst NoteExpress
×
提示
您的信息不完整,为了账户安全,请先补充。
现在去补充
×
提示
您因"违规操作"
具体请查看互助需知
我知道了
×
提示
确定
请完成安全验证×
copy
已复制链接
快去分享给好友吧!
我知道了
右上角分享
点击右上角分享
0
联系我们:info@booksci.cn Book学术提供免费学术资源搜索服务,方便国内外学者检索中英文文献。致力于提供最便捷和优质的服务体验。 Copyright © 2023 布克学术 All rights reserved.
京ICP备2023020795号-1
ghs 京公网安备 11010802042870号
Book学术文献互助
Book学术文献互助群
群 号:481959085
Book学术官方微信