基于COTS的空间微电路辐射测试结果

1997 IEEE Radiation Effects Data Workshop NSREC Snowmass 1997. Workshop Record Held in conjunction with IEEE Nuclear and Space Radiation Effects Conference Pub Date : 1997-07-24 DOI:10.1109/REDW.1997.629792

P. Layton, D. Strobel, H. Anthony, R. Boss, J. Marshall, J. Parkinson, J. Spratt, B. Passenheim

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引用次数: 8

摘要

我们提供了在空间电子公司收集的用于候选航天器微电子的重离子单事件效应(SEE)和总电离剂量(TID)数据。

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Radiation testing results of COTS based space microcircuits

We present both heavy ion single event effect (SEE) and total ionizing dose (TID) data collected at Space Electronics Inc. for candidate spacecraft microelectronics.

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来源期刊

1997 IEEE Radiation Effects Data Workshop NSREC Snowmass 1997. Workshop Record Held in conjunction with IEEE Nuclear and Space Radiation Effects Conference

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