T. Iizuka, K. Ochii, T. Ohtani, T. Kondo, S. Koyhama
{"title":"全静态16Kb大块CMOS RAM","authors":"T. Iizuka, K. Ochii, T. Ohtani, T. Kondo, S. Koyhama","doi":"10.1109/ISSCC.1980.1156077","DOIUrl":null,"url":null,"abstract":"A coplanar Si-gate CMOS process used in the design of a fully static 16Kb bulk CMOS RAM with a six-transistor cell will be covered. RAM offers a typical 95ns access time with 200mW power dissipation and 1μW standby power.","PeriodicalId":229101,"journal":{"name":"1980 IEEE International Solid-State Circuits Conference. Digest of Technical Papers","volume":"1 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"1900-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"10","resultStr":"{\"title\":\"Fully static 16Kb bulk CMOS RAM\",\"authors\":\"T. Iizuka, K. Ochii, T. Ohtani, T. Kondo, S. Koyhama\",\"doi\":\"10.1109/ISSCC.1980.1156077\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"A coplanar Si-gate CMOS process used in the design of a fully static 16Kb bulk CMOS RAM with a six-transistor cell will be covered. RAM offers a typical 95ns access time with 200mW power dissipation and 1μW standby power.\",\"PeriodicalId\":229101,\"journal\":{\"name\":\"1980 IEEE International Solid-State Circuits Conference. Digest of Technical Papers\",\"volume\":\"1 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"1900-01-01\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"10\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"1980 IEEE International Solid-State Circuits Conference. Digest of Technical Papers\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/ISSCC.1980.1156077\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"1980 IEEE International Solid-State Circuits Conference. Digest of Technical Papers","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/ISSCC.1980.1156077","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
A coplanar Si-gate CMOS process used in the design of a fully static 16Kb bulk CMOS RAM with a six-transistor cell will be covered. RAM offers a typical 95ns access time with 200mW power dissipation and 1μW standby power.