{"title":"纳米尺度太吵了?-设备和电路中随机电报噪声(RTN)的增加","authors":"Runsheng Wang, Shaofeng Guo, P. Ren, Mulong Luo, Jibin Zou, Ru Huang","doi":"10.1109/INEC.2016.7589405","DOIUrl":null,"url":null,"abstract":"This paper gives an outline of our recent findings on the random telegraph noise (RTN) in nanoscale MOS devices and circuits.","PeriodicalId":416565,"journal":{"name":"2016 IEEE International Nanoelectronics Conference (INEC)","volume":"38 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2016-05-09","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"5","resultStr":"{\"title\":\"Too noisy at the nanoscale? — The rise of random telegraph noise (RTN) in devices and circuits\",\"authors\":\"Runsheng Wang, Shaofeng Guo, P. Ren, Mulong Luo, Jibin Zou, Ru Huang\",\"doi\":\"10.1109/INEC.2016.7589405\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"This paper gives an outline of our recent findings on the random telegraph noise (RTN) in nanoscale MOS devices and circuits.\",\"PeriodicalId\":416565,\"journal\":{\"name\":\"2016 IEEE International Nanoelectronics Conference (INEC)\",\"volume\":\"38 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2016-05-09\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"5\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"2016 IEEE International Nanoelectronics Conference (INEC)\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/INEC.2016.7589405\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"2016 IEEE International Nanoelectronics Conference (INEC)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/INEC.2016.7589405","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}