Alyson D. Topper, M. O’Bryan, E. Wilcox, Thomas A. Carstens, Jonathan D. Barth, M. Berg, M. Casey, Matthew B. Joplin, J. Lauenstein, M. Campola, Donna J. Cochran, J. Pellish, Peter J. Majewicz
{"title":"美国宇航局戈达德太空飞行中心最近的辐射效应测试结果","authors":"Alyson D. Topper, M. O’Bryan, E. Wilcox, Thomas A. Carstens, Jonathan D. Barth, M. Berg, M. Casey, Matthew B. Joplin, J. Lauenstein, M. Campola, Donna J. Cochran, J. Pellish, Peter J. Majewicz","doi":"10.1109/REDW56037.2022.9921535","DOIUrl":null,"url":null,"abstract":"Total ionizing dose, displacement damage dose, and single event effects testing were performed to characterize and determine the suitability of candidate electronics for NASA space utilization. Devices tested include FPGAs, optoelectronics, digital, analog, and bipolar devices.","PeriodicalId":202271,"journal":{"name":"2022 IEEE Radiation Effects Data Workshop (REDW) (in conjunction with 2022 NSREC)","volume":"13 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2022-07-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":"{\"title\":\"NASA Goddard Space Flight Center’s Recent Radiation Effects Test Results\",\"authors\":\"Alyson D. Topper, M. O’Bryan, E. Wilcox, Thomas A. Carstens, Jonathan D. Barth, M. Berg, M. Casey, Matthew B. Joplin, J. Lauenstein, M. Campola, Donna J. Cochran, J. Pellish, Peter J. Majewicz\",\"doi\":\"10.1109/REDW56037.2022.9921535\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"Total ionizing dose, displacement damage dose, and single event effects testing were performed to characterize and determine the suitability of candidate electronics for NASA space utilization. Devices tested include FPGAs, optoelectronics, digital, analog, and bipolar devices.\",\"PeriodicalId\":202271,\"journal\":{\"name\":\"2022 IEEE Radiation Effects Data Workshop (REDW) (in conjunction with 2022 NSREC)\",\"volume\":\"13 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2022-07-01\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"0\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"2022 IEEE Radiation Effects Data Workshop (REDW) (in conjunction with 2022 NSREC)\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/REDW56037.2022.9921535\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"2022 IEEE Radiation Effects Data Workshop (REDW) (in conjunction with 2022 NSREC)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/REDW56037.2022.9921535","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
NASA Goddard Space Flight Center’s Recent Radiation Effects Test Results
Total ionizing dose, displacement damage dose, and single event effects testing were performed to characterize and determine the suitability of candidate electronics for NASA space utilization. Devices tested include FPGAs, optoelectronics, digital, analog, and bipolar devices.