{"title":"作为一组测试人员的推动者的可移植性缩影","authors":"R. Marion","doi":"10.1109/AUTEST.2011.6058756","DOIUrl":null,"url":null,"abstract":"The paper will analyze a single simple instrument type to focus on ensuring transportability across a family of automated test equipment (ATE) testers. Transportability analysis and multiple hosting across a family of testers are important topics in advanced test and diagnosis of electronic assemblies. The ATE instrument type selected is direct current (DC) power supplies, where application of a DC voltage is complicated by impedance, transient and load characteristics. The ideal condition of a test program set (TPS) is the ability to tolerate the conditions described, but that condition is rarely achieved. Therefore, the family of testers must exhibit consistent behavior regardless of instrument manufacturer.","PeriodicalId":110721,"journal":{"name":"2011 IEEE AUTOTESTCON","volume":"67 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2011-10-24","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":"{\"title\":\"A transportability microcosm as an enabler for a family of testers\",\"authors\":\"R. Marion\",\"doi\":\"10.1109/AUTEST.2011.6058756\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"The paper will analyze a single simple instrument type to focus on ensuring transportability across a family of automated test equipment (ATE) testers. Transportability analysis and multiple hosting across a family of testers are important topics in advanced test and diagnosis of electronic assemblies. The ATE instrument type selected is direct current (DC) power supplies, where application of a DC voltage is complicated by impedance, transient and load characteristics. The ideal condition of a test program set (TPS) is the ability to tolerate the conditions described, but that condition is rarely achieved. Therefore, the family of testers must exhibit consistent behavior regardless of instrument manufacturer.\",\"PeriodicalId\":110721,\"journal\":{\"name\":\"2011 IEEE AUTOTESTCON\",\"volume\":\"67 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2011-10-24\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"0\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"2011 IEEE AUTOTESTCON\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/AUTEST.2011.6058756\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"2011 IEEE AUTOTESTCON","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/AUTEST.2011.6058756","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
A transportability microcosm as an enabler for a family of testers
The paper will analyze a single simple instrument type to focus on ensuring transportability across a family of automated test equipment (ATE) testers. Transportability analysis and multiple hosting across a family of testers are important topics in advanced test and diagnosis of electronic assemblies. The ATE instrument type selected is direct current (DC) power supplies, where application of a DC voltage is complicated by impedance, transient and load characteristics. The ideal condition of a test program set (TPS) is the ability to tolerate the conditions described, but that condition is rarely achieved. Therefore, the family of testers must exhibit consistent behavior regardless of instrument manufacturer.
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