{"title":"TAB包封剂在线热和微波固化的仿真与分析","authors":"R. Pennisi","doi":"10.1109/EEMTS.1988.75951","DOIUrl":null,"url":null,"abstract":"A commercially available epoxy encapsulant was crosslinked using several curing profiles. The thermal and dielectric properties were characterized during and after the curing process. The results were used to develop an efficient curing profile using inline infrared- and microwave-assisted curing ovens.<<ETX>>","PeriodicalId":137899,"journal":{"name":"Fourth IEEE/CHMT European International Electronic Manufacturing Technology Symposium","volume":"17 7","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"1988-06-13","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"1","resultStr":"{\"title\":\"Simulation and analysis of in-line thermal and microwave curing of TAB encapsulants\",\"authors\":\"R. Pennisi\",\"doi\":\"10.1109/EEMTS.1988.75951\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"A commercially available epoxy encapsulant was crosslinked using several curing profiles. The thermal and dielectric properties were characterized during and after the curing process. The results were used to develop an efficient curing profile using inline infrared- and microwave-assisted curing ovens.<<ETX>>\",\"PeriodicalId\":137899,\"journal\":{\"name\":\"Fourth IEEE/CHMT European International Electronic Manufacturing Technology Symposium\",\"volume\":\"17 7\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"1988-06-13\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"1\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"Fourth IEEE/CHMT European International Electronic Manufacturing Technology Symposium\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/EEMTS.1988.75951\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"Fourth IEEE/CHMT European International Electronic Manufacturing Technology Symposium","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/EEMTS.1988.75951","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
Simulation and analysis of in-line thermal and microwave curing of TAB encapsulants
A commercially available epoxy encapsulant was crosslinked using several curing profiles. The thermal and dielectric properties were characterized during and after the curing process. The results were used to develop an efficient curing profile using inline infrared- and microwave-assisted curing ovens.<>