ARM1026EJ微处理器内核的可测试性特点

International Test Conference, 2003. Proceedings. ITC 2003. Pub Date : 2003-09-30 DOI:10.1109/TEST.2003.1270907

T. McLaurin, F. Frederick, R. Slobodnik

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引用次数: 10

摘要

本文描述了arm1026ej微处理器内核所面临的DFT和测试挑战，以及所采用的解决方案。已经创建了新的DFT技术来解决分发DFT核心解决方案的挑战，这些解决方案最终将在许多不同的环境中结束。这个核心被实例化为一个测试芯片。新的DFT特征在SOC中得到了成功的应用。

本文章由计算机程序翻译，如有差异，请以英文原文为准。

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The testability features of the ARM1026EJ microprocessor core

The DFT and Test challenges faced, and the solutions applied, to the ARMl026EJ microprocessor core are described in this paper. New DFT techniques have been created to address the challenges of distributing a DFT core solution that will ultimately end up in many different environments. This core was instantiated into a test chip. The new DFT features were utilized successfully in the SOC.

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International Test Conference, 2003. Proceedings. ITC 2003.

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