{"title":"一种实用的MIMD网络诊断方法","authors":"C. Aktouf, G. Mazaré, C. Robach, R. Velazco","doi":"10.1109/ATS.1992.224411","DOIUrl":null,"url":null,"abstract":"The authors present a self-diagnosis approach for validating a MIMD fine grain network. Based on a simple fault model, the authors propose an O(n/sup 2/) self diagnosis algorithm which is executed in a pipeline fashion. The functional test program of the processors together with simulation results are given.<<ETX>>","PeriodicalId":208029,"journal":{"name":"Proceedings First Asian Test Symposium (ATS `92)","volume":"55 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"1992-11-26","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"8","resultStr":"{\"title\":\"A practical approach for the diagnosis of a MIMD network\",\"authors\":\"C. Aktouf, G. Mazaré, C. Robach, R. Velazco\",\"doi\":\"10.1109/ATS.1992.224411\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"The authors present a self-diagnosis approach for validating a MIMD fine grain network. Based on a simple fault model, the authors propose an O(n/sup 2/) self diagnosis algorithm which is executed in a pipeline fashion. The functional test program of the processors together with simulation results are given.<<ETX>>\",\"PeriodicalId\":208029,\"journal\":{\"name\":\"Proceedings First Asian Test Symposium (ATS `92)\",\"volume\":\"55 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"1992-11-26\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"8\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"Proceedings First Asian Test Symposium (ATS `92)\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/ATS.1992.224411\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"Proceedings First Asian Test Symposium (ATS `92)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/ATS.1992.224411","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
A practical approach for the diagnosis of a MIMD network
The authors present a self-diagnosis approach for validating a MIMD fine grain network. Based on a simple fault model, the authors propose an O(n/sup 2/) self diagnosis algorithm which is executed in a pipeline fashion. The functional test program of the processors together with simulation results are given.<>