{"title":"用于增强模拟和混合信号ip可靠性的嵌入式仪器","authors":"J. Wan, H. Kerkhoff","doi":"10.1109/NEWCAS.2015.7181979","DOIUrl":null,"url":null,"abstract":"The idea of an embedded instrument (EI) is to embed some form of test and measurement into silicon to characterize, debug and test chips. The concept of the EI is different from build-in self test (BIST) and other kinds of monitors by the fact that embedded instruments can provide the user with rich and detailed information with respect to the performances of the target, not just a true/false indication. In this paper, two embedded instruments for analogue and mixed-signal IPs focusing on dependability applications are introduced. They are the EI for measuring MOS transistors' threshold voltage and the EI for testing OpAmps' gain and offset. Measurements as well as simulation results are provided to validate these EIs and show their efficiency in monitoring the ageing of analogue and mixed-signal IPs in their life time, and enable the path to enhance dependability.","PeriodicalId":404655,"journal":{"name":"2015 IEEE 13th International New Circuits and Systems Conference (NEWCAS)","volume":"15 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2015-06-07","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"5","resultStr":"{\"title\":\"Embedded instruments for enhancing dependability of analogue and mixed-signal IPs\",\"authors\":\"J. Wan, H. Kerkhoff\",\"doi\":\"10.1109/NEWCAS.2015.7181979\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"The idea of an embedded instrument (EI) is to embed some form of test and measurement into silicon to characterize, debug and test chips. The concept of the EI is different from build-in self test (BIST) and other kinds of monitors by the fact that embedded instruments can provide the user with rich and detailed information with respect to the performances of the target, not just a true/false indication. In this paper, two embedded instruments for analogue and mixed-signal IPs focusing on dependability applications are introduced. They are the EI for measuring MOS transistors' threshold voltage and the EI for testing OpAmps' gain and offset. Measurements as well as simulation results are provided to validate these EIs and show their efficiency in monitoring the ageing of analogue and mixed-signal IPs in their life time, and enable the path to enhance dependability.\",\"PeriodicalId\":404655,\"journal\":{\"name\":\"2015 IEEE 13th International New Circuits and Systems Conference (NEWCAS)\",\"volume\":\"15 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2015-06-07\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"5\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"2015 IEEE 13th International New Circuits and Systems Conference (NEWCAS)\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/NEWCAS.2015.7181979\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"2015 IEEE 13th International New Circuits and Systems Conference (NEWCAS)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/NEWCAS.2015.7181979","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
Embedded instruments for enhancing dependability of analogue and mixed-signal IPs
The idea of an embedded instrument (EI) is to embed some form of test and measurement into silicon to characterize, debug and test chips. The concept of the EI is different from build-in self test (BIST) and other kinds of monitors by the fact that embedded instruments can provide the user with rich and detailed information with respect to the performances of the target, not just a true/false indication. In this paper, two embedded instruments for analogue and mixed-signal IPs focusing on dependability applications are introduced. They are the EI for measuring MOS transistors' threshold voltage and the EI for testing OpAmps' gain and offset. Measurements as well as simulation results are provided to validate these EIs and show their efficiency in monitoring the ageing of analogue and mixed-signal IPs in their life time, and enable the path to enhance dependability.
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