缩放设备中信号持续时间敏感退化

2023 IEEE International Reliability Physics Symposium (IRPS) Pub Date : 2023-03-01 DOI:10.1109/IRPS48203.2023.10118314

G. Bersuker, E. Tang, D. Veksler

{"title":"缩放设备中信号持续时间敏感退化","authors":"G. Bersuker, E. Tang, D. Veksler","doi":"10.1109/IRPS48203.2023.10118314","DOIUrl":null,"url":null,"abstract":"Defect generation controlling device degradation is found to be highly sensitive to the signal duration in circuitry-relevant operation frequencies (GHz). Stressing devices in ns-time range reveals greatly extended device lifetimes compared to conventional evaluation conditions. The role of energy generation/dissipation in scaled devices is discussed.","PeriodicalId":159030,"journal":{"name":"2023 IEEE International Reliability Physics Symposium (IRPS)","volume":"13 1-4 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2023-03-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":"{\"title\":\"Signal duration sensitive degradation in scaled devices\",\"authors\":\"G. Bersuker, E. Tang, D. Veksler\",\"doi\":\"10.1109/IRPS48203.2023.10118314\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"Defect generation controlling device degradation is found to be highly sensitive to the signal duration in circuitry-relevant operation frequencies (GHz). Stressing devices in ns-time range reveals greatly extended device lifetimes compared to conventional evaluation conditions. The role of energy generation/dissipation in scaled devices is discussed.\",\"PeriodicalId\":159030,\"journal\":{\"name\":\"2023 IEEE International Reliability Physics Symposium (IRPS)\",\"volume\":\"13 1-4 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2023-03-01\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"0\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"2023 IEEE International Reliability Physics Symposium (IRPS)\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/IRPS48203.2023.10118314\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"2023 IEEE International Reliability Physics Symposium (IRPS)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/IRPS48203.2023.10118314","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}

引用次数: 0

摘要

在电路相关工作频率(GHz)下，控制器件退化的缺陷产生对信号持续时间高度敏感。与传统的评估条件相比，在ns时间范围内对设备进行应力分析可以大大延长设备的使用寿命。讨论了能量产生/耗散在缩放器件中的作用。

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Signal duration sensitive degradation in scaled devices

Defect generation controlling device degradation is found to be highly sensitive to the signal duration in circuitry-relevant operation frequencies (GHz). Stressing devices in ns-time range reveals greatly extended device lifetimes compared to conventional evaluation conditions. The role of energy generation/dissipation in scaled devices is discussed.

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2023 IEEE International Reliability Physics Symposium (IRPS)

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