不同工艺制作的厚膜电阻器的稳定性和可靠性

A. Pietrikova, J. Urbančík, S. Slosarcik, M. Bujaloboková, J. Potencki, A. Kolek
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引用次数: 0

摘要

比较了不同工艺制备的厚膜电阻器的稳定性和可靠性。通过对刻蚀法制备的厚膜电阻器与常规厚膜电阻器的比较,实现了这一目的。介绍了结合光刻、LTCC加工和PCB制版技术的刻蚀技术,作为制作“平面”电阻器的一种新思路。我们表明,有可能开发出适用于标准厚膜技术的器件,并且有可能制造出具有更高稳定性和可靠性的3D(平面)电阻器。我们选择低温共烧陶瓷(LTCC)作为操作材料,因为它可以制造三维结构,并且与丝网印刷工艺兼容。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
Stability and reliability of thick film resistors constructed by different techniques
Comparison of the stability and reliability of thick film resistors prepared by different techniques is discussed in this work. This aim was accomplished by comparison of the thick film resistors prepared by etching and conventional thick film technology. The etching technique as a combination of three techniques (photolithography, LTCC processing and PCB patterning technology) was introduced for construction of "planar" resistors as a new idea. We show that it is possible to develop devices that are useful in standard thick film technology and that it is possible to fabricate 3D (planar) resistors with higher stability and reliability. As operating material we selected low temperature co-fired ceramic (LTCC), because it allows the fabrication of three-dimensional structures, and it is compatible with the screen-printing process.
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