用单端口矢量网络分析仪测量放大器的两罐s参数

Yen-Chung Lin, T. Chu
{"title":"用单端口矢量网络分析仪测量放大器的两罐s参数","authors":"Yen-Chung Lin, T. Chu","doi":"10.1109/APMC.2016.7931429","DOIUrl":null,"url":null,"abstract":"This paper describes a measurement technique to reconstruct the two-port scattering parameters of an amplifier from five one-port results measured by a vector network analyzer (VNA). Formulation on the use of auxiliary circuits and one-port VNA is given. The criterion in selecting the auxiliary circuit is also addressed. The reconstructed results are shown in close agreement with the directly measured results.","PeriodicalId":166478,"journal":{"name":"2016 Asia-Pacific Microwave Conference (APMC)","volume":"34 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2016-12-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":"{\"title\":\"Measurement of two-pot S-parameters of an amplifier using one-port vector network analyzer\",\"authors\":\"Yen-Chung Lin, T. Chu\",\"doi\":\"10.1109/APMC.2016.7931429\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"This paper describes a measurement technique to reconstruct the two-port scattering parameters of an amplifier from five one-port results measured by a vector network analyzer (VNA). Formulation on the use of auxiliary circuits and one-port VNA is given. The criterion in selecting the auxiliary circuit is also addressed. The reconstructed results are shown in close agreement with the directly measured results.\",\"PeriodicalId\":166478,\"journal\":{\"name\":\"2016 Asia-Pacific Microwave Conference (APMC)\",\"volume\":\"34 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2016-12-01\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"0\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"2016 Asia-Pacific Microwave Conference (APMC)\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/APMC.2016.7931429\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"2016 Asia-Pacific Microwave Conference (APMC)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/APMC.2016.7931429","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 0

摘要

本文介绍了一种由矢量网络分析仪(VNA)测量的5个单端口散射参数重建放大器双端口散射参数的测量技术。给出了辅助电路和单端口VNA的使用公式。文中还讨论了辅助电路选择的准则。重建结果与实测结果吻合较好。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
Measurement of two-pot S-parameters of an amplifier using one-port vector network analyzer
This paper describes a measurement technique to reconstruct the two-port scattering parameters of an amplifier from five one-port results measured by a vector network analyzer (VNA). Formulation on the use of auxiliary circuits and one-port VNA is given. The criterion in selecting the auxiliary circuit is also addressed. The reconstructed results are shown in close agreement with the directly measured results.
求助全文
通过发布文献求助,成功后即可免费获取论文全文。 去求助
来源期刊
自引率
0.00%
发文量
0
×
引用
GB/T 7714-2015
复制
MLA
复制
APA
复制
导出至
BibTeX EndNote RefMan NoteFirst NoteExpress
×
提示
您的信息不完整,为了账户安全,请先补充。
现在去补充
×
提示
您因"违规操作"
具体请查看互助需知
我知道了
×
提示
确定
请完成安全验证×
copy
已复制链接
快去分享给好友吧!
我知道了
右上角分享
点击右上角分享
0
联系我们:info@booksci.cn Book学术提供免费学术资源搜索服务,方便国内外学者检索中英文文献。致力于提供最便捷和优质的服务体验。 Copyright © 2023 布克学术 All rights reserved.
京ICP备2023020795号-1
ghs 京公网安备 11010802042870号
Book学术文献互助
Book学术文献互助群
群 号:481959085
Book学术官方微信