{"title":"用单端口矢量网络分析仪测量放大器的两罐s参数","authors":"Yen-Chung Lin, T. Chu","doi":"10.1109/APMC.2016.7931429","DOIUrl":null,"url":null,"abstract":"This paper describes a measurement technique to reconstruct the two-port scattering parameters of an amplifier from five one-port results measured by a vector network analyzer (VNA). Formulation on the use of auxiliary circuits and one-port VNA is given. The criterion in selecting the auxiliary circuit is also addressed. The reconstructed results are shown in close agreement with the directly measured results.","PeriodicalId":166478,"journal":{"name":"2016 Asia-Pacific Microwave Conference (APMC)","volume":"34 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2016-12-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":"{\"title\":\"Measurement of two-pot S-parameters of an amplifier using one-port vector network analyzer\",\"authors\":\"Yen-Chung Lin, T. Chu\",\"doi\":\"10.1109/APMC.2016.7931429\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"This paper describes a measurement technique to reconstruct the two-port scattering parameters of an amplifier from five one-port results measured by a vector network analyzer (VNA). Formulation on the use of auxiliary circuits and one-port VNA is given. The criterion in selecting the auxiliary circuit is also addressed. The reconstructed results are shown in close agreement with the directly measured results.\",\"PeriodicalId\":166478,\"journal\":{\"name\":\"2016 Asia-Pacific Microwave Conference (APMC)\",\"volume\":\"34 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2016-12-01\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"0\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"2016 Asia-Pacific Microwave Conference (APMC)\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/APMC.2016.7931429\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"2016 Asia-Pacific Microwave Conference (APMC)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/APMC.2016.7931429","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
Measurement of two-pot S-parameters of an amplifier using one-port vector network analyzer
This paper describes a measurement technique to reconstruct the two-port scattering parameters of an amplifier from five one-port results measured by a vector network analyzer (VNA). Formulation on the use of auxiliary circuits and one-port VNA is given. The criterion in selecting the auxiliary circuit is also addressed. The reconstructed results are shown in close agreement with the directly measured results.