{"title":"自动测试生成的定位与后效","authors":"Zhongcheng Li, Yuqi Pan, Y. Min","doi":"10.1109/ATS.1992.224440","DOIUrl":null,"url":null,"abstract":"Improvement on efficiency of test pattern generation (TPG) algorithms for large combinational circuits has long been a major concern. Two new concepts, localization and aftereffect, are introduced to enhance the efficiency. Based on the concepts, three techniques, partial implication, aftereffect of identified undetectable faults and shared sensitization, are adopted in a TPG system, SABATPG. Experiments for the 10 ISCAS benchmark circuits show that the computing time of SABATPG for test generation is 19.42% shorter than that of FAN algorithm.<<ETX>>","PeriodicalId":208029,"journal":{"name":"Proceedings First Asian Test Symposium (ATS `92)","volume":"41 8","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"1992-11-26","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":"{\"title\":\"Localization and aftereffect of automatic test generation\",\"authors\":\"Zhongcheng Li, Yuqi Pan, Y. Min\",\"doi\":\"10.1109/ATS.1992.224440\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"Improvement on efficiency of test pattern generation (TPG) algorithms for large combinational circuits has long been a major concern. Two new concepts, localization and aftereffect, are introduced to enhance the efficiency. Based on the concepts, three techniques, partial implication, aftereffect of identified undetectable faults and shared sensitization, are adopted in a TPG system, SABATPG. Experiments for the 10 ISCAS benchmark circuits show that the computing time of SABATPG for test generation is 19.42% shorter than that of FAN algorithm.<<ETX>>\",\"PeriodicalId\":208029,\"journal\":{\"name\":\"Proceedings First Asian Test Symposium (ATS `92)\",\"volume\":\"41 8\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"1992-11-26\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"0\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"Proceedings First Asian Test Symposium (ATS `92)\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/ATS.1992.224440\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"Proceedings First Asian Test Symposium (ATS `92)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/ATS.1992.224440","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
Localization and aftereffect of automatic test generation
Improvement on efficiency of test pattern generation (TPG) algorithms for large combinational circuits has long been a major concern. Two new concepts, localization and aftereffect, are introduced to enhance the efficiency. Based on the concepts, three techniques, partial implication, aftereffect of identified undetectable faults and shared sensitization, are adopted in a TPG system, SABATPG. Experiments for the 10 ISCAS benchmark circuits show that the computing time of SABATPG for test generation is 19.42% shorter than that of FAN algorithm.<>
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