C. Dale, P. Marshall, M.E. Fritz, M. de la Chapelle, M. Carts, K. Label
{"title":"高性能光纤数据总线的系统级辐射响应","authors":"C. Dale, P. Marshall, M.E. Fritz, M. de la Chapelle, M. Carts, K. Label","doi":"10.1109/RADECS.1995.509833","DOIUrl":null,"url":null,"abstract":"We present experimental determinations of the total ionizing dose response and the proton-induced Single Event Upset (SEU) sensitivity of components comprising a 200 Mbps star coupled fiber optic data bus. These results are compared with the in-situ response of the operating system under proton bombardment, resulting in excellent correlation of the system error rate with proton-induced bit errors in the receiver photodiode. Modeling and error rate predictions for orbital performance indicate robust tolerance to even harsh natural space environments.","PeriodicalId":310087,"journal":{"name":"Proceedings of the Third European Conference on Radiation and its Effects on Components and Systems","volume":"63 ","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"1995-09-18","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"8","resultStr":"{\"title\":\"System level radiation response of a high performance fiber optic data bus\",\"authors\":\"C. Dale, P. Marshall, M.E. Fritz, M. de la Chapelle, M. Carts, K. Label\",\"doi\":\"10.1109/RADECS.1995.509833\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"We present experimental determinations of the total ionizing dose response and the proton-induced Single Event Upset (SEU) sensitivity of components comprising a 200 Mbps star coupled fiber optic data bus. These results are compared with the in-situ response of the operating system under proton bombardment, resulting in excellent correlation of the system error rate with proton-induced bit errors in the receiver photodiode. Modeling and error rate predictions for orbital performance indicate robust tolerance to even harsh natural space environments.\",\"PeriodicalId\":310087,\"journal\":{\"name\":\"Proceedings of the Third European Conference on Radiation and its Effects on Components and Systems\",\"volume\":\"63 \",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"1995-09-18\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"8\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"Proceedings of the Third European Conference on Radiation and its Effects on Components and Systems\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/RADECS.1995.509833\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"Proceedings of the Third European Conference on Radiation and its Effects on Components and Systems","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/RADECS.1995.509833","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
System level radiation response of a high performance fiber optic data bus
We present experimental determinations of the total ionizing dose response and the proton-induced Single Event Upset (SEU) sensitivity of components comprising a 200 Mbps star coupled fiber optic data bus. These results are compared with the in-situ response of the operating system under proton bombardment, resulting in excellent correlation of the system error rate with proton-induced bit errors in the receiver photodiode. Modeling and error rate predictions for orbital performance indicate robust tolerance to even harsh natural space environments.