使用静态、/spl delta/IDDQ和动态测试套件测试DSM:实现和结果

International Test Conference, 2003. Proceedings. ITC 2003. Pub Date : 2003-09-30 DOI:10.1109/TEST.2003.1270828

Y. Nishizaki, O. Nakayama, Chiaki Matsumoto, Yoshitaka Kimura, Toshimi Kobayashi, Hiroyuki Nakamura

{"title":"使用静态、/spl delta/IDDQ和动态测试套件测试DSM:实现和结果","authors":"Y. Nishizaki, O. Nakayama, Chiaki Matsumoto, Yoshitaka Kimura, Toshimi Kobayashi, Hiroyuki Nakamura","doi":"10.1109/TEST.2003.1270828","DOIUrl":null,"url":null,"abstract":"This paper presents the implementation and results of the test suite for DSM ASIC consisting of static, \\DeltaIddq, and dynamic patterns based on scan, and quantitatively reports the advantages of dynamic pattern over AC static pattern, even at a low frequency, and advantages of \\DeltaIddq test over traditional Iddq. A defect level calculation method is presented which decomposes the defect level into, and considers interaction between, static, \\DeltaIddq, dynamic, and memory BIST defects. Defect density and defect level are also reported based on the new method.","PeriodicalId":236182,"journal":{"name":"International Test Conference, 2003. Proceedings. ITC 2003.","volume":"38 3","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2003-09-30","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"6","resultStr":"{\"title\":\"Testing DSM asic with static, /spl delta/IDDQ, and dynamic test suite: implementation and results\",\"authors\":\"Y. Nishizaki, O. Nakayama, Chiaki Matsumoto, Yoshitaka Kimura, Toshimi Kobayashi, Hiroyuki Nakamura\",\"doi\":\"10.1109/TEST.2003.1270828\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"This paper presents the implementation and results of the test suite for DSM ASIC consisting of static, \\\\DeltaIddq, and dynamic patterns based on scan, and quantitatively reports the advantages of dynamic pattern over AC static pattern, even at a low frequency, and advantages of \\\\DeltaIddq test over traditional Iddq. A defect level calculation method is presented which decomposes the defect level into, and considers interaction between, static, \\\\DeltaIddq, dynamic, and memory BIST defects. Defect density and defect level are also reported based on the new method.\",\"PeriodicalId\":236182,\"journal\":{\"name\":\"International Test Conference, 2003. Proceedings. ITC 2003.\",\"volume\":\"38 3\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2003-09-30\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"6\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"International Test Conference, 2003. Proceedings. ITC 2003.\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/TEST.2003.1270828\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"International Test Conference, 2003. Proceedings. ITC 2003.","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/TEST.2003.1270828","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}

引用次数: 6

摘要

本文介绍了基于扫描的由静态、DeltaIddq和动态模式组成的DSM ASIC测试套件的实现和结果，并定量地报告了动态模式优于交流静态模式的优点，即使在低频下也是如此，DeltaIddq测试优于传统Iddq测试。提出了一种缺陷等级的计算方法，将缺陷等级分解为静态缺陷、DeltaIddq缺陷、动态缺陷和内存缺陷，并考虑它们之间的相互作用。在此基础上还报告了缺陷密度和缺陷等级。

本文章由计算机程序翻译，如有差异，请以英文原文为准。

查看原文本刊更多论文

Testing DSM asic with static, /spl delta/IDDQ, and dynamic test suite: implementation and results

This paper presents the implementation and results of the test suite for DSM ASIC consisting of static, \DeltaIddq, and dynamic patterns based on scan, and quantitatively reports the advantages of dynamic pattern over AC static pattern, even at a low frequency, and advantages of \DeltaIddq test over traditional Iddq. A defect level calculation method is presented which decomposes the defect level into, and considers interaction between, static, \DeltaIddq, dynamic, and memory BIST defects. Defect density and defect level are also reported based on the new method.

求助全文

通过发布文献求助，成功后即可免费获取论文全文。去求助

来源期刊

International Test Conference, 2003. Proceedings. ITC 2003.

自引率

0.00%

发文量