{"title":"微系统热流传感器测试结构温度分布的计算","authors":"S. V. Fomenko, R. P. Dikareva, O. V. Lobach","doi":"10.1109/SIBEDM.2007.4292929","DOIUrl":null,"url":null,"abstract":"In the article the test structure of the microsystem heat flux sensor is presented. Computation methods of temperature distribution which allow counting output parameters and a sensitivity of the heat flux sensor are considered. Results of a numerical modeling and their comparison with an analytical computation of a temperature distribution in the sensor are given.","PeriodicalId":106151,"journal":{"name":"2007 8th Siberian Russian Workshop and Tutorial on Electron Devices and Materials","volume":"20 9","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2007-07-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":"{\"title\":\"Computation of Temperature Distribution into Test Structure of Microsystem Heat Flux Sensor\",\"authors\":\"S. V. Fomenko, R. P. Dikareva, O. V. Lobach\",\"doi\":\"10.1109/SIBEDM.2007.4292929\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"In the article the test structure of the microsystem heat flux sensor is presented. Computation methods of temperature distribution which allow counting output parameters and a sensitivity of the heat flux sensor are considered. Results of a numerical modeling and their comparison with an analytical computation of a temperature distribution in the sensor are given.\",\"PeriodicalId\":106151,\"journal\":{\"name\":\"2007 8th Siberian Russian Workshop and Tutorial on Electron Devices and Materials\",\"volume\":\"20 9\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2007-07-01\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"0\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"2007 8th Siberian Russian Workshop and Tutorial on Electron Devices and Materials\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/SIBEDM.2007.4292929\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"2007 8th Siberian Russian Workshop and Tutorial on Electron Devices and Materials","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/SIBEDM.2007.4292929","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
Computation of Temperature Distribution into Test Structure of Microsystem Heat Flux Sensor
In the article the test structure of the microsystem heat flux sensor is presented. Computation methods of temperature distribution which allow counting output parameters and a sensitivity of the heat flux sensor are considered. Results of a numerical modeling and their comparison with an analytical computation of a temperature distribution in the sensor are given.