{"title":"利用EKV模型研究模拟/射频电路的线性度指标，并比较三种不同CMOS工艺的结果","authors":"Gholamreza Khademevatan, A. Jalali","doi":"10.1109/IICM57986.2022.10152418","DOIUrl":null,"url":null,"abstract":"The paper reports on a reliable design methodology for linearity of analog/RF circuits based on EKV model and its main parameter, the inversion coefficient (IC). In this procedure, the linearity value is studied in all regions from WI to SI. Two important linearity indices, AldB and AIP3, are investigated for single-stage and two stage differential amplifiers and finally the optimum value of inversion coefficient is calculated for biasing of circuit devices.","PeriodicalId":131546,"journal":{"name":"2022 Iranian International Conference on Microelectronics (IICM)","volume":"18 14","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2022-12-20","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":"{\"title\":\"Study of linearity indices in analog/RF circuits using EKV model and comparing the results in three different CMOS processes\",\"authors\":\"Gholamreza Khademevatan, A. Jalali\",\"doi\":\"10.1109/IICM57986.2022.10152418\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"The paper reports on a reliable design methodology for linearity of analog/RF circuits based on EKV model and its main parameter, the inversion coefficient (IC). In this procedure, the linearity value is studied in all regions from WI to SI. Two important linearity indices, AldB and AIP3, are investigated for single-stage and two stage differential amplifiers and finally the optimum value of inversion coefficient is calculated for biasing of circuit devices.\",\"PeriodicalId\":131546,\"journal\":{\"name\":\"2022 Iranian International Conference on Microelectronics (IICM)\",\"volume\":\"18 14\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2022-12-20\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"0\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"2022 Iranian International Conference on Microelectronics (IICM)\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/IICM57986.2022.10152418\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"2022 Iranian International Conference on Microelectronics (IICM)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/IICM57986.2022.10152418","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
Study of linearity indices in analog/RF circuits using EKV model and comparing the results in three different CMOS processes
The paper reports on a reliable design methodology for linearity of analog/RF circuits based on EKV model and its main parameter, the inversion coefficient (IC). In this procedure, the linearity value is studied in all regions from WI to SI. Two important linearity indices, AldB and AIP3, are investigated for single-stage and two stage differential amplifiers and finally the optimum value of inversion coefficient is calculated for biasing of circuit devices.
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