Edoardo Nicolò Aiello, Alfonsina D'Iorio, Federica Solca, Silvia Torre, Ruggero Bonetti, Francesco Scheveger, Eleonora Colombo, Alessio Maranzano, Luca Maderna, Claudia Morelli, Alberto Doretti, Marianna Amboni, Carmine Vitale, Federico Verde, Roberta Ferrucci, Sergio Barbieri, Eleonora Zirone, Alberto Priori, Gabriella Pravettoni, Gabriella Santangelo, Vincenzo Silani, Nicola Ticozzi, Andrea Ciammola, Barbara Poletti
{"title":"更正:意大利语版额叶评估测试(FAB)在非痴呆帕金森病患者中的临床测量和可行性。","authors":"Edoardo Nicolò Aiello, Alfonsina D'Iorio, Federica Solca, Silvia Torre, Ruggero Bonetti, Francesco Scheveger, Eleonora Colombo, Alessio Maranzano, Luca Maderna, Claudia Morelli, Alberto Doretti, Marianna Amboni, Carmine Vitale, Federico Verde, Roberta Ferrucci, Sergio Barbieri, Eleonora Zirone, Alberto Priori, Gabriella Pravettoni, Gabriella Santangelo, Vincenzo Silani, Nicola Ticozzi, Andrea Ciammola, Barbara Poletti","doi":"10.1007/s00702-023-02690-x","DOIUrl":null,"url":null,"abstract":"","PeriodicalId":3,"journal":{"name":"ACS Applied Electronic Materials","volume":null,"pages":null},"PeriodicalIF":4.3000,"publicationDate":"2024-09-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":"{\"title\":\"Correction: Clinimetrics and feasibility of the Italian version of the Frontal Assessment Battery (FAB) in non-demented Parkinson's disease patients.\",\"authors\":\"Edoardo Nicolò Aiello, Alfonsina D'Iorio, Federica Solca, Silvia Torre, Ruggero Bonetti, Francesco Scheveger, Eleonora Colombo, Alessio Maranzano, Luca Maderna, Claudia Morelli, Alberto Doretti, Marianna Amboni, Carmine Vitale, Federico Verde, Roberta Ferrucci, Sergio Barbieri, Eleonora Zirone, Alberto Priori, Gabriella Pravettoni, Gabriella Santangelo, Vincenzo Silani, Nicola Ticozzi, Andrea Ciammola, Barbara Poletti\",\"doi\":\"10.1007/s00702-023-02690-x\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"\",\"PeriodicalId\":3,\"journal\":{\"name\":\"ACS Applied Electronic Materials\",\"volume\":null,\"pages\":null},\"PeriodicalIF\":4.3000,\"publicationDate\":\"2024-09-01\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"0\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"ACS Applied Electronic Materials\",\"FirstCategoryId\":\"3\",\"ListUrlMain\":\"https://doi.org/10.1007/s00702-023-02690-x\",\"RegionNum\":3,\"RegionCategory\":\"材料科学\",\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"Q1\",\"JCRName\":\"ENGINEERING, ELECTRICAL & ELECTRONIC\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"ACS Applied Electronic Materials","FirstCategoryId":"3","ListUrlMain":"https://doi.org/10.1007/s00702-023-02690-x","RegionNum":3,"RegionCategory":"材料科学","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"Q1","JCRName":"ENGINEERING, ELECTRICAL & ELECTRONIC","Score":null,"Total":0}
引用次数: 0