A study for the new-type ACF applications of FCOF assembly

W. Jong, S. Peng
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Abstract

Due to the environmental protection issues and regulations, a lot of electronic material suppliers try to search for the replacement materials which include the lead-free solder joints and the anisotropic conductive films (ACFs). ACF is widely used in high quality, excellent signal interconnection and fine pitch products. Nevertheless, during the fast flow and curing process of the electronic material, the risk of voiding may be increased. This study focuses on the characteristics and phenomena of a new-type ACF on the outer lead bonding (OLB) for flip chip on flex substrate (FCOF) assembly. Firstly, the thermal response and curing capability of the new-type ACF is investigated by the experiment. And the numerical simulation is used by computer aided engineering (CAE) that shows the heating effect of components on the bonding process. Both the simulated and experimental results can obtain the similar thermal behaviors. For the reliability assessment of the new-type ACF, the experiment procedures are adjusted three parameters of temperature, pressure and time under the bonding process. It can be easily discovered that the delaminations or cracks is caused by a lower compliance behavior of the interfaces between bumps on the polyimide (PI) substrate and indium tin oxides (ITOs) on the glass substrate. In order to evaluate the adhesive strength of ACF through the thermal loading, the strength of FCOF assembly is measured by a 90-degree peel test and is verified by the CAE simulation. In this study, the minimum peel strength of the new-type ACF has to be greater than 400 g/cm in order to satisfy the specification. Then, a stripped meshed model is simulated to understand the fracture growth between each interface under a constant speed of 8mm/sec. It can be found that the initial creak starts from the ACF-glass substrate interface and then propagates to the ITO. Finally, the swelling phenomenon of the new-type ACF is investigated. It shows that the swelling will not affect the structure of components and the reliability assessment is good.
新型ACF在fof装配中的应用研究
由于环保问题和法规的要求,许多电子材料供应商试图寻找替代材料,其中包括无铅焊点和各向异性导电膜(ACFs)。ACF广泛应用于高质量、优良的信号互连和小间距产品。然而,在电子材料的快速流动和固化过程中,可能会增加空化的风险。本文研究了柔性基板上倒装芯片(fof)外引线键合(OLB)上新型ACF的特性和现象。首先,通过实验研究了新型ACF的热响应和固化性能。通过计算机辅助工程(CAE)的数值模拟,揭示了构件的热效应对粘接过程的影响。模拟结果和实验结果都可以得到相似的热行为。针对新型ACF的可靠性评估,调整了粘接过程中温度、压力和时间三个参数的实验程序。可以很容易地发现,分层或裂纹是由于聚酰亚胺(PI)衬底上的凸起与玻璃衬底上的铟锡氧化物(ito)之间的界面的顺应性较低引起的。为了通过热载荷评价ACF的粘接强度,采用90度剥离试验测量了FCOF组件的强度,并通过CAE模拟进行了验证。在本研究中,新型ACF的最小剥离强度必须大于400g /cm才能满足规范要求。然后,模拟了条带网格模型,以了解在8mm/sec恒定速度下各界面之间的断裂扩展情况。可以发现,初始裂纹从acf -玻璃基板界面开始,然后传播到ITO。最后对新型ACF的膨胀现象进行了研究。结果表明,膨胀不会影响构件的结构,可靠性评估良好。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
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