Research On FOPLP Package of multi-chip Power Module

Jing Jiang, J. Huo, Guangdong Song, H. Ye, Debo Liu, Guoqi Zhang, Jun Tao Jun Wang
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引用次数: 2

Abstract

Power devices are developing for the small volume, high performance and modularization. With more and more application scenarios of Brushless Direct Current Motor (BLDC), MOSFET multi-chip module (MCM) is popular with people. However, the conventional wire Bonding and Copper clip welding technology struggles to meet the requirements for the excessive heat accumulation and complex logic problems in MCM. While the above problems can be well solved by using the new Fan out panel level packing(FOPLP) technology for QFN packaging of multi-chip. The traditional welding technology is used at the bottom of the chip, and the copper porous link is used at the top of the chip with low parasitic capacitance, inductance and low Rdson in electrical performance. In respect to thermal management, the θJC on the top of the chip can be reduced, which has the effect of double-sided heat dissipation. Top Layer interconnection technology is adopted in the packaging scheme, which can have complex circuit layout.This paper mainly describes the technical implementation of this packaging technology, adopting the finite element software to establish a three-dimensional model of a new type of FOPLP and wire welding packaging for MCM. The thermal resistance of different packaging schemes is calculated to confirm the advantages and disadvantages of different schemes by the way of thermal simulation, the internal temperature distribution of different packaging structures and the main influencing factors of the thermal resistance of packaging compared.
多芯片电源模块FOPLP封装研究
功率器件正朝着小体积、高性能、模块化的方向发展。随着无刷直流电机(BLDC)的应用场景越来越多,MOSFET多芯片模块(MCM)受到人们的青睐。然而,传统的线键合和铜夹焊接技术难以满足MCM中过多的热量积累和复杂的逻辑问题。而采用新的扇出面板级封装(FOPLP)技术进行多芯片QFN封装,可以很好地解决上述问题。芯片底部采用传统焊接技术,芯片顶部采用铜多孔链路,寄生电容、电感低,电学性能低。在热管理方面,可以降低芯片顶部的θJC,具有双面散热的效果。封装方案采用顶层互连技术,可实现复杂的电路布局。本文主要描述了该封装技术的技术实现,采用有限元软件建立了一种新型FOPLP和MCM焊丝封装的三维模型。通过热模拟计算不同包装方案的热阻,确定不同包装方案的优缺点,对不同包装结构内部温度分布及包装热阻的主要影响因素进行比较。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
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