Precision temperature measurement unit for the low temperature dielectrometer

Abstract

The description of the precision temperature measurement unit for measuring temperature of the investigated samples in the low-temperature dielectrometer in the range of 0.3 - 300 K with an accuracy of 0.05 K is given. Four-wire measurement circuit on an alternating current with use of the semiconductor temperature sensor (semiconductor film resistance thermometer) in the whole temperature range is implemented. The dielectric losses in a number of low-loss materials were measured in the millimeter wavelength range and a wide temperature range by using the designed unit. The example of the temperature dependence of the dielectric loss in gold doped silicon (Si:Au) is given.