Impact of Process-Related Flux Contamination on the Electronics Reliability Issues Under Detrimental Climatic Conditions

K. Piotrowska, Simone Laganá, M. Jellesen, R. Ambat
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引用次数: 3

Abstract

The reliability issues faced by modern electronic devices are inherently related to the non-optimized manufacturing process, which leaves behind a substantial amount of soldering residues of an aggressive nature. The use of flux systems for soldering purposes is vital, however, upon exposure of the device to harsh climatic conditions, it can result in the compromised corrosion reliability of the Printed Circuit Board Assembly (PCBA) due to the corrosive nature of the flux system. In this paper, the behavior of reflow process-related solder flux residues was investigated. The evolutions of potentially corrosive flux components from the soldered pads exposed to high humidity and temperature conditions was studied as a function of exposure climate and solder paste type using the acidity indication gel test. Changes in the filmformer morphology due to the climatic exposure were visualized using light optical and scanning electron microscopy, and correlated to the observations from the gel test. Quantification of the residue level was performed using the conductivity measurements. Results show that evolution of acidic residues from the reflow-soldered pads occurs upon exposure to high temperature and humidity levels. The exposure time defines the extent of evolution, and it was found to be typically directly proportional.
在不利的气候条件下,过程相关的通量污染对电子可靠性问题的影响
现代电子设备面临的可靠性问题本质上与未优化的制造过程有关,这留下了大量具有侵略性的焊接残留物。使用助焊剂系统进行焊接是至关重要的,然而,在设备暴露于恶劣的气候条件下,由于助焊剂系统的腐蚀性,它可能导致印刷电路板组件(PCBA)的腐蚀可靠性受损。本文研究了回流焊过程中焊剂残留的行为。利用酸性指示凝胶试验研究了暴露在高湿和高温条件下的焊盘中潜在腐蚀性助焊剂成分的演变,作为暴露气候和锡膏类型的函数。利用光学显微镜和扫描电子显微镜观察了由于气候暴露导致的成膜形态变化,并将其与凝胶试验的观察结果相关联。使用电导率测量进行残留水平的定量。结果表明,在高温高湿条件下,回流焊焊盘的酸性残留物会发生演变。暴露时间决定了进化的程度,并且发现它通常是成正比的。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
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