Modelling and characterization of dynamic behavior of coupled memristor circuits

J. Eshraghian, H. Iu, T. Fernando, Dongsheng Yu, Zhen Li
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引用次数: 17

Abstract

This paper explores the dynamic behavior of dual flux coupled memristor circuits in order to further ascertain fundamental theory of memristor circuits. Different cases of flux coupling are mathematically modelled where two memristors are connected in both series and parallel, with consideration given to the polarity of each device. The dynamic behavior is characterized based on the constitutive relations, with a variation of memductance represented in terms of flux, charge, voltage and current. The agreement between theoretical and simulation analyses affirm the memristor closure theorem with coupled memristor circuits behaving as a different type of memristor with higher complexity.
耦合忆阻电路动态特性的建模与表征
本文对双磁通耦合忆阻电路的动态特性进行了研究,以进一步确定忆阻电路的基本理论。在两个忆阻器串联和并联的情况下,考虑到每个器件的极性,对磁通耦合的不同情况进行了数学建模。动态特性是基于本构关系,用磁通、电荷、电压和电流表示磁导的变化。理论分析和仿真分析的一致性证实了忆阻器闭合定理,耦合忆阻电路表现为一种不同类型的忆阻器,具有更高的复杂性。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
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