D. Ory, A. Bercegol, D. Suchet, Jean-Baptiste Puel, Amadéo Michaud, A. B. Slimane, S. Collin, Stefania Cacovich, Olivier Fournier, Amelle Rebai, J. Rousset, J. Guillemoles, L. Lombez
{"title":"Multi-dimensional luminescence imaging: accessing transport properties","authors":"D. Ory, A. Bercegol, D. Suchet, Jean-Baptiste Puel, Amadéo Michaud, A. B. Slimane, S. Collin, Stefania Cacovich, Olivier Fournier, Amelle Rebai, J. Rousset, J. Guillemoles, L. Lombez","doi":"10.1109/PVSC40753.2019.9198955","DOIUrl":null,"url":null,"abstract":"Among all the characterization methods in the photovoltaic research area the luminescence luminescence-based ones offer multiple advantages. Indeed, it is possible to analyze both photovoltaic materials and devices in a quantitative way since the luminescence signals are linked to several photovoltaic conversion mechanisms such as the voltage generation, charge extraction or diffusion length. Here we use imaging methods to probe the transport properties and/or image material inhomogeneities. By using multi multi-dimensional imaging systems, we show how we can broaden the range of determined optoelectronic properties. A focus is made on transport properties applied to multiple PV absorbers.","PeriodicalId":6749,"journal":{"name":"2019 IEEE 46th Photovoltaic Specialists Conference (PVSC)","volume":"37 1","pages":"1-4"},"PeriodicalIF":0.0000,"publicationDate":"2019-06-16","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"2019 IEEE 46th Photovoltaic Specialists Conference (PVSC)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/PVSC40753.2019.9198955","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 0
Abstract
Among all the characterization methods in the photovoltaic research area the luminescence luminescence-based ones offer multiple advantages. Indeed, it is possible to analyze both photovoltaic materials and devices in a quantitative way since the luminescence signals are linked to several photovoltaic conversion mechanisms such as the voltage generation, charge extraction or diffusion length. Here we use imaging methods to probe the transport properties and/or image material inhomogeneities. By using multi multi-dimensional imaging systems, we show how we can broaden the range of determined optoelectronic properties. A focus is made on transport properties applied to multiple PV absorbers.