V. Parthasarathy, R. Zhu, V. Khemka, T. Roggenbauer, A. Bose, P. Hui, P. Rodriquez, J. Nivison, D. Collins, Z. Wu, I. Puchades, M. Butner
{"title":"A 0.25/spl mu/m CMOS based 70V smart power technology with deep trench for high-voltage isolation","authors":"V. Parthasarathy, R. Zhu, V. Khemka, T. Roggenbauer, A. Bose, P. Hui, P. Rodriquez, J. Nivison, D. Collins, Z. Wu, I. Puchades, M. Butner","doi":"10.1109/IEDM.2002.1175878","DOIUrl":null,"url":null,"abstract":"Presents a 0.25/spl mu/m CMOS based smart power platform on a P++ substrate with a deep trench high-voltage isolation as a low-cost alternative to SOI in realizing significant analog shrink, reduction of substrate parasitics and 70V high-side capability without affecting analog matching and process complexity.","PeriodicalId":74909,"journal":{"name":"Technical digest. International Electron Devices Meeting","volume":"11 3 1","pages":"459-462"},"PeriodicalIF":0.0000,"publicationDate":"2002-12-08","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"56","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"Technical digest. International Electron Devices Meeting","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/IEDM.2002.1175878","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 56
Abstract
Presents a 0.25/spl mu/m CMOS based smart power platform on a P++ substrate with a deep trench high-voltage isolation as a low-cost alternative to SOI in realizing significant analog shrink, reduction of substrate parasitics and 70V high-side capability without affecting analog matching and process complexity.