Reliability of 20µm pitch NCF type COF package with compliant-bump

Yu-Min Lin, Su-Tsai Lu, Tai-Hong Chen
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引用次数: 5

Abstract

In this study, three kinds of NCF adhesives named as NCF I, NCF II and NCF III, were applied to COF package with compliant-bump. Firstly, to investigate bonding temperature effects, the curing rate of the NCFs and strength of interconnection under different bonding temperatures (150 °C ∼ 230 °C) were evaluated using differential scanning calorimeter (DSC) test and a 90 degree peeling test, respectively. Then, the electrical performances of NCF joints bonded at different bonding temperatures were monitored by measuring daisy chain and insulated resistance. After that, the reliability tests of 85 °C / 85 % RH thermal humidity storage test (THST), and 55 °C ∼ 125 °C thermal cycling test (TCT) were performed. Finally, the cross-section images of failure samples from SEM were observed to find the failure mode.
20µm间距NCF型COF封装的可靠性
本研究将三种NCF胶粘剂NCF I、NCF II和NCF III应用于凹凸凹凸的COF包装。首先,为了研究键合温度的影响,分别使用差示扫描量热计(DSC)测试和90度剥离测试评估了不同键合温度(150°C ~ 230°C)下nfc的固化速率和互连强度。然后,通过测量雏菊链和绝缘电阻,监测不同连接温度下NCF接头的电性能。之后,进行85°C / 85% RH热湿储存试验(THST)和55°C ~ 125°C热循环试验(TCT)的可靠性试验。最后,通过扫描电镜观察破坏试样的截面图,找出破坏模式。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
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