Effect of electric field and temperature variability on spin dephasing in SiGe nanowires

B. Bishnoi, S. Chishti, A. Verma, Akshaykumar Salimath, B. Ghosh
{"title":"Effect of electric field and temperature variability on spin dephasing in SiGe nanowires","authors":"B. Bishnoi, S. Chishti, A. Verma, Akshaykumar Salimath, B. Ghosh","doi":"10.1109/CDE.2013.6481373","DOIUrl":null,"url":null,"abstract":"In this paper, we use semi classical Monte Carlo method to investigate Effect of electric field and temperature variability on spin polarized transport in SiGe nanowires (SiGeNWs) with Ge mole fraction of 0.2, 0.4, 0.6 and 0.8. We use a multi-subbands semi classical Monte Carlo approach to model spin dephasing. Monte Carlo simulations have been widely adopted to study electron transport in devices and have recently been used in conjunction with spin density matrix calculations to model spin transport. Spin dephasing in SiGe nanowires (SiGeNWs) is caused due to D'yakonov-Perel (DP) relaxation and due to Elliott-Yafet (EY) relaxation. The components of ensemble averaged spin variation have been studied for SiGe nanowires (SiGeNWs) along the nanowires length. The effect of variation of electric field and temperature on spin dephasing length has been studied. It is found that variation of the electric field does not affect spin dephasing length significantly but spin dephasing length decrease as Ge mole fraction increases from 0.2 to 0.8 for the same value of electric field in SiGe nanowires (SiGeNWs). The effect of variation of temperature is more visible and as temperature increases from 10K to 300K spin dephasing length decrease due to dominant increase of acoustic phonon scattering and it decrease more dominantly for higher value of Ge mole fraction such as 0.8 compare to 0.2.","PeriodicalId":6614,"journal":{"name":"2013 Spanish Conference on Electron Devices","volume":"3 1","pages":"183-186"},"PeriodicalIF":0.0000,"publicationDate":"2013-03-21","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"2013 Spanish Conference on Electron Devices","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/CDE.2013.6481373","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 0

Abstract

In this paper, we use semi classical Monte Carlo method to investigate Effect of electric field and temperature variability on spin polarized transport in SiGe nanowires (SiGeNWs) with Ge mole fraction of 0.2, 0.4, 0.6 and 0.8. We use a multi-subbands semi classical Monte Carlo approach to model spin dephasing. Monte Carlo simulations have been widely adopted to study electron transport in devices and have recently been used in conjunction with spin density matrix calculations to model spin transport. Spin dephasing in SiGe nanowires (SiGeNWs) is caused due to D'yakonov-Perel (DP) relaxation and due to Elliott-Yafet (EY) relaxation. The components of ensemble averaged spin variation have been studied for SiGe nanowires (SiGeNWs) along the nanowires length. The effect of variation of electric field and temperature on spin dephasing length has been studied. It is found that variation of the electric field does not affect spin dephasing length significantly but spin dephasing length decrease as Ge mole fraction increases from 0.2 to 0.8 for the same value of electric field in SiGe nanowires (SiGeNWs). The effect of variation of temperature is more visible and as temperature increases from 10K to 300K spin dephasing length decrease due to dominant increase of acoustic phonon scattering and it decrease more dominantly for higher value of Ge mole fraction such as 0.8 compare to 0.2.
电场和温度变化对SiGe纳米线自旋消相的影响
本文采用半经典蒙特卡罗方法研究了电场和温度变化对锗摩尔分数为0.2、0.4、0.6和0.8的SiGe纳米线(SiGeNWs)自旋极化输运的影响。我们使用多子带半经典蒙特卡罗方法来模拟自旋消相。蒙特卡罗模拟已被广泛应用于研究器件中的电子输运,并且最近已与自旋密度矩阵计算结合使用来模拟自旋输运。SiGe纳米线(SiGeNWs)中的自旋失相是由D'yakonov-Perel (DP)弛豫和elliot - yafet (EY)弛豫引起的。研究了SiGe纳米线系综平均自旋随纳米线长度变化的组成。研究了电场和温度变化对自旋消相长度的影响。研究发现,电场的变化对SiGe纳米线的自旋脱相长度影响不大,但在电场相同的情况下,随着Ge摩尔分数从0.2增加到0.8,自旋脱相长度减小。温度变化的影响更为明显,从10K到300K,随着温度的升高,自旋减相长度的减小主要是声子散射的增加,当Ge摩尔分数为0.8时,自旋减相长度的减小更为明显。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
求助全文
约1分钟内获得全文 求助全文
来源期刊
自引率
0.00%
发文量
0
×
引用
GB/T 7714-2015
复制
MLA
复制
APA
复制
导出至
BibTeX EndNote RefMan NoteFirst NoteExpress
×
提示
您的信息不完整,为了账户安全,请先补充。
现在去补充
×
提示
您因"违规操作"
具体请查看互助需知
我知道了
×
提示
确定
请完成安全验证×
copy
已复制链接
快去分享给好友吧!
我知道了
右上角分享
点击右上角分享
0
联系我们:info@booksci.cn Book学术提供免费学术资源搜索服务,方便国内外学者检索中英文文献。致力于提供最便捷和优质的服务体验。 Copyright © 2023 布克学术 All rights reserved.
京ICP备2023020795号-1
ghs 京公网安备 11010802042870号
Book学术文献互助
Book学术文献互助群
群 号:481959085
Book学术官方微信