Analog/Mixed-Signal Circuit Testing Technologies in IoT Era

Abstract

This paper introduces our production testing research results for analog and mixed-signal SoC in IoT era, such as operational amplifier, ADC, sampling circuit, timing related testing technologies. Notice that production testing and measurement / characterization for ICs are similar but different, and this paper introduces the former. The analog / mixed-signal testing plays a very important role in achieving both reliability and low cost for IoT and automotive systems. It also is a big technological challenge because there is no general method, but it requires state-of-the-art combination and optimization of a wide variety of technologies including circuit and system design as well as signal processing, control and measurement algorithms. Their overview including future technology challenges is described.