Yun Meng, Xinglong Ji, P. Han, Zhitang Song, Wangyang Zhou, Wen-Yu Guo, Bo Qian, Liangcai Wu
{"title":"Thermal Stability Improvement of Sb2Te Material with Rapid Phase Transition","authors":"Yun Meng, Xinglong Ji, P. Han, Zhitang Song, Wangyang Zhou, Wen-Yu Guo, Bo Qian, Liangcai Wu","doi":"10.1149/2.0031501SSL","DOIUrl":null,"url":null,"abstract":"In this paper, phase change characteristics of SiO2-doped Sb2Te materials were \n\tsystematically investigated. It was found that phase change properties of Sb2Te were \n\tremarkably improved through SiO2 addition. The crystallization temperature is \n\tenhanced obviously, showing a relatively good thermal stability. With increasing \n\tconcentration of SiO2, the temperature for 10-yr data retention increased to 131 \n\tdegrees C. In addition, the SiO2-doped Sb2Te based device remains a fast operation \n\tspeed (10 ns). XRD and TEM results suggest the incorporation of SiO2 suppress the \n\tcrystallization of Sb2Te and then smaller grain size obtained, which benefits to the \n\toperation speed and power consumption. (C) 2014 The Electrochemical Society. All \n\trights reserved.","PeriodicalId":11423,"journal":{"name":"ECS Solid State Letters","volume":"37 1","pages":""},"PeriodicalIF":0.0000,"publicationDate":"2014-11-07","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"6","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"ECS Solid State Letters","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1149/2.0031501SSL","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 6
Abstract
In this paper, phase change characteristics of SiO2-doped Sb2Te materials were
systematically investigated. It was found that phase change properties of Sb2Te were
remarkably improved through SiO2 addition. The crystallization temperature is
enhanced obviously, showing a relatively good thermal stability. With increasing
concentration of SiO2, the temperature for 10-yr data retention increased to 131
degrees C. In addition, the SiO2-doped Sb2Te based device remains a fast operation
speed (10 ns). XRD and TEM results suggest the incorporation of SiO2 suppress the
crystallization of Sb2Te and then smaller grain size obtained, which benefits to the
operation speed and power consumption. (C) 2014 The Electrochemical Society. All
rights reserved.