RX-PUF: Low Power, Dense, Reliable, and Resilient Physically Unclonable Functions Based on Analog Passive RRAM Crossbar Arrays

M. Mahmoodi, H. Nili, D. Strukov
{"title":"RX-PUF: Low Power, Dense, Reliable, and Resilient Physically Unclonable Functions Based on Analog Passive RRAM Crossbar Arrays","authors":"M. Mahmoodi, H. Nili, D. Strukov","doi":"10.1109/VLSIT.2018.8510624","DOIUrl":null,"url":null,"abstract":"We propose a novel architecture (\"RX-PUF\") for physically unclonable functions (PUF) based on analog RRAM crossbar array circuits. RX-PUF takes advantage of unique RRAM properties, such as I-V nonlinearity, and its device-to-device (d2d) variations and tunability. As a proof of concept, we have prototyped a 600 kb challenge response pair (CRP) PUF using 250 nm half-pitch (F) 20×20 crossbar arrays with passively integrated devices. The RX-PUF prototype features excellent physical characteristics, e.g. ~1600 F2/bit density and up to 41 fJ/bit energy efficiency. Its functional performance, improved by utilizing hidden input, is also very promising. The measured bit error rate (BER) was 0.7% at RT and ≤ 5.3% at 100°C, even without using any error correction methods. The measured responses showed near-ideal uniformity (50.04%) and inter-HD (50.12%) and passed all relevant NIST randomness tests. The preliminary results showed also very high resilience of RX-PUF against machine learning (ML) attacks.","PeriodicalId":6561,"journal":{"name":"2018 IEEE Symposium on VLSI Technology","volume":"126 1","pages":"99-100"},"PeriodicalIF":0.0000,"publicationDate":"2018-06-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"14","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"2018 IEEE Symposium on VLSI Technology","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/VLSIT.2018.8510624","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 14

Abstract

We propose a novel architecture ("RX-PUF") for physically unclonable functions (PUF) based on analog RRAM crossbar array circuits. RX-PUF takes advantage of unique RRAM properties, such as I-V nonlinearity, and its device-to-device (d2d) variations and tunability. As a proof of concept, we have prototyped a 600 kb challenge response pair (CRP) PUF using 250 nm half-pitch (F) 20×20 crossbar arrays with passively integrated devices. The RX-PUF prototype features excellent physical characteristics, e.g. ~1600 F2/bit density and up to 41 fJ/bit energy efficiency. Its functional performance, improved by utilizing hidden input, is also very promising. The measured bit error rate (BER) was 0.7% at RT and ≤ 5.3% at 100°C, even without using any error correction methods. The measured responses showed near-ideal uniformity (50.04%) and inter-HD (50.12%) and passed all relevant NIST randomness tests. The preliminary results showed also very high resilience of RX-PUF against machine learning (ML) attacks.
RX-PUF:基于模拟无源RRAM交叉棒阵列的低功耗、密集、可靠和弹性物理不可克隆功能
我们提出了一种基于模拟RRAM交叉棒阵列电路的物理不可克隆功能(PUF)的新架构(“RX-PUF”)。RX-PUF利用了独特的RRAM特性,例如I-V非线性,以及器件到器件(d2d)的变化和可调性。作为概念验证,我们使用250 nm半间距(F) 20×20交叉杆阵列和被动集成器件制作了600 kb挑战响应对(CRP) PUF原型。RX-PUF原型具有优异的物理特性,例如~1600 F2/位密度和高达41 fJ/位的能量效率。通过使用隐藏输入来提高其功能性能,也很有前景。即使不使用任何纠错方法,在室温下测得的误码率(BER)为0.7%,在100°C时测得的误码率≤5.3%。测量的反应显示出接近理想的均匀性(50.04%)和hd间(50.12%),并通过了所有相关的NIST随机性测试。初步结果还显示,RX-PUF对机器学习(ML)攻击的弹性非常高。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
求助全文
约1分钟内获得全文 求助全文
来源期刊
自引率
0.00%
发文量
0
×
引用
GB/T 7714-2015
复制
MLA
复制
APA
复制
导出至
BibTeX EndNote RefMan NoteFirst NoteExpress
×
提示
您的信息不完整,为了账户安全,请先补充。
现在去补充
×
提示
您因"违规操作"
具体请查看互助需知
我知道了
×
提示
确定
请完成安全验证×
copy
已复制链接
快去分享给好友吧!
我知道了
右上角分享
点击右上角分享
0
联系我们:info@booksci.cn Book学术提供免费学术资源搜索服务,方便国内外学者检索中英文文献。致力于提供最便捷和优质的服务体验。 Copyright © 2023 布克学术 All rights reserved.
京ICP备2023020795号-1
ghs 京公网安备 11010802042870号
Book学术文献互助
Book学术文献互助群
群 号:481959085
Book学术官方微信