Comparison between optical and electrical data on hole concentration in zinc-doped p-GaAs

A. Belov, V. E. Kanevskii, E. I. Kladova, S. Knyazev, N. Y. Komarovskiy, I. B. Parfent'eva, Evgeniya V. Chernyshova
{"title":"Comparison between optical and electrical data on hole concentration in zinc-doped p-GaAs","authors":"A. Belov, V. E. Kanevskii, E. I. Kladova, S. Knyazev, N. Y. Komarovskiy, I. B. Parfent'eva, Evgeniya V. Chernyshova","doi":"10.3897/j.moem.9.109743","DOIUrl":null,"url":null,"abstract":"The optical and electrical properties of zinc-doped Cz p-GaAs have been studied. Reflection spectra of ten p-GaAs specimens have been taken in the mid-IR region. Van der Pau galvanomagnetic, electrical resistivity and Hall coefficient measurements have been carried out for the same specimens (all the measurements were carried out at room temperature). The reflection spectra have been processed using the Kramers–Kronig relations, spectral dependences of the real and imaginary parts of the complex dielectric permeability have been calculated and loss function curves have been plotted. The loss function maximum position has been used to calculate the characteristic wavenumber corresponding to the high-frequency plasmon-phonon mode frequency. Theoretical calculations have been conducted and a calibration curve has been built up for determining heavy hole concentration in p-GaAs at T = 295 K based on known characteristic wavenumber. Further matching of the optical and Hall data has been used for determining the light to heavy hole mobility ratio. This ratio proves to be in the 1.9–2.8 range which is far lower as compared with theoretical predictions in the assumption of the same scattering mechanism for light and heavy holes (at optical phonons). It has been hypothesized that the scattering mechanisms for light and heavy holes differ.","PeriodicalId":18610,"journal":{"name":"Modern Electronic Materials","volume":"47 1","pages":""},"PeriodicalIF":0.0000,"publicationDate":"2023-07-05","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"Modern Electronic Materials","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.3897/j.moem.9.109743","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
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Abstract

The optical and electrical properties of zinc-doped Cz p-GaAs have been studied. Reflection spectra of ten p-GaAs specimens have been taken in the mid-IR region. Van der Pau galvanomagnetic, electrical resistivity and Hall coefficient measurements have been carried out for the same specimens (all the measurements were carried out at room temperature). The reflection spectra have been processed using the Kramers–Kronig relations, spectral dependences of the real and imaginary parts of the complex dielectric permeability have been calculated and loss function curves have been plotted. The loss function maximum position has been used to calculate the characteristic wavenumber corresponding to the high-frequency plasmon-phonon mode frequency. Theoretical calculations have been conducted and a calibration curve has been built up for determining heavy hole concentration in p-GaAs at T = 295 K based on known characteristic wavenumber. Further matching of the optical and Hall data has been used for determining the light to heavy hole mobility ratio. This ratio proves to be in the 1.9–2.8 range which is far lower as compared with theoretical predictions in the assumption of the same scattering mechanism for light and heavy holes (at optical phonons). It has been hypothesized that the scattering mechanisms for light and heavy holes differ.
掺锌p-GaAs中空穴浓度的光学与电学数据比较
研究了掺杂锌的czp - gaas的光学和电学性质。对10个p-GaAs样品的中红外反射光谱进行了测量。对同一试样进行了范德波磁、电阻率和霍尔系数测量(所有测量均在室温下进行)。利用Kramers-Kronig关系对反射光谱进行了处理,计算了复介电渗透率实部和虚部的谱依赖关系,并绘制了损耗函数曲线。利用损失函数最大位置计算了高频等离子体声子模式频率对应的特征波数。根据已知的特征波数,进行了理论计算,建立了测定T = 295 K时p-GaAs中重空穴浓度的校准曲线。光学和霍尔数据的进一步匹配用于确定轻重空穴迁移率。这一比率被证明在1.9-2.8的范围内,这远远低于理论预测,假设在相同的散射机制的轻和重空穴(在光学声子)。据推测,轻空穴和重空穴的散射机制不同。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
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