K. Yoh, H. Taniguchi, K. Kiyomi, M. Inoue, R. Sakamoto
{"title":"One dimensional electron transport and drain current quantization at 77 K in InAs heterojunction quantum wires","authors":"K. Yoh, H. Taniguchi, K. Kiyomi, M. Inoue, R. Sakamoto","doi":"10.1109/IEDM.1991.235300","DOIUrl":null,"url":null,"abstract":"The authors have fabricated quantum wires on the InAs/AlGaSb heterostructure by utilizing electron beam lithography and wet-chemical etching. The electron confinement into quasi-one-dimensional freedom of motion was verified by magnetoresistance measurement at 4.2 K. In two terminal devices with extremely narrow channel structure, quantized drain current through drain-induced barrier lowering has been observed at 77 K. Coulomb oscillations and Coulomb staircases were seen to overlap with staircase u characteristics reflecting the small parasitic capacitance between terminals. Material, structural, and temperature effects on these devices were examined.<<ETX>>","PeriodicalId":13885,"journal":{"name":"International Electron Devices Meeting 1991 [Technical Digest]","volume":"15 1","pages":"813-816"},"PeriodicalIF":0.0000,"publicationDate":"1991-12-08","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"1","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"International Electron Devices Meeting 1991 [Technical Digest]","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/IEDM.1991.235300","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 1
Abstract
The authors have fabricated quantum wires on the InAs/AlGaSb heterostructure by utilizing electron beam lithography and wet-chemical etching. The electron confinement into quasi-one-dimensional freedom of motion was verified by magnetoresistance measurement at 4.2 K. In two terminal devices with extremely narrow channel structure, quantized drain current through drain-induced barrier lowering has been observed at 77 K. Coulomb oscillations and Coulomb staircases were seen to overlap with staircase u characteristics reflecting the small parasitic capacitance between terminals. Material, structural, and temperature effects on these devices were examined.<>