Dark-field line confocal imaging with point confocality and extended line field for bulk defects detection

IF 3.3 2区物理与天体物理 Q2 OPTICS

Chinese Optics Letters Pub Date : 2023-01-01 DOI:10.3788/col202321.041203

Jingtao Dong, Tengda Zhang, Lei Yang, Yuzhong Zhang, R. Lu, Xinglong Xie

引用次数: 0

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基于点共焦和扩展线场的暗场线共聚焦成像用于体缺陷检测

本文章由计算机程序翻译，如有差异，请以英文原文为准。

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来源期刊

Chinese Optics Letters 物理-光学

CiteScore

5.60

自引率

20.00%

发文量

180

审稿时长

2.3 months

期刊介绍： Chinese Optics Letters (COL) is an international journal aimed at the rapid dissemination of latest, important discoveries and inventions in all branches of optical science and technology. It is considered to be one of the most important journals in optics in China. It is collected by The Optical Society (OSA) Publishing Digital Library and also indexed by Science Citation Index (SCI), Engineering Index (EI), etc. COL is distinguished by its short review period (~30 days) and publication period (~100 days). With its debut in January 2003, COL is published monthly by Chinese Laser Press, and distributed by OSA outside of Chinese Mainland.

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