Adhesion Property of Polyimide and Passivation Layer for Polymer/metal Wafer-Level Hybrid Bonding in 3D Integration

Cheng-Hsien Lu, Y. Kho, Yu-Tao Yang, Yu‐Pei Chen, Chiao-Pei Chen, Tsung-Tai Hung, Chiu-Feng Chen, Kuan-Neng Chen
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引用次数: 4

Abstract

In this paper, the four-point bending method experiments were carried out with different polyimides and passivation layers for realization of adhesion property below 400°C. Three types of passivation layers, thermal oxide, tetraethoxysilane (TEOS) oxide, silicon nitride, and three types of polyimides, with hydrophobic silane, with hydrophilic silane and without silane, and annealing temperature were all considered in this paper. Moreover, the relation between adhesion strength and surface roughness is discussed. Finally, a low thermal budget (250-375°C) polyimide/metal hybrid bonding scheme with good stress release was proposed for future hybrid bonding applications.
三维集成中聚合物/金属晶圆级杂化键合中聚酰亚胺与钝化层的粘附性能
本文采用不同的聚酰亚胺和钝化层进行四点弯曲法实验,以实现在400℃以下的粘接性能。本文考虑了热氧化物、四乙氧基硅烷(TEOS)氧化物、氮化硅和三种聚酰亚胺(疏水硅烷、亲水硅烷和无硅烷)的钝化层以及退火温度。此外,还讨论了附着强度与表面粗糙度的关系。最后,提出了一种低热预算(250-375°C)具有良好应力释放的聚酰亚胺/金属杂化键合方案,用于未来的杂化键合应用。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
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