The effect on X-ray line broadening of variation of crystallite size with depth below the specimen surface

Abstract

The breadth of an x-ray diffraction line has been calculated for a grain having a finite absorption coefficient and divided by reflecting planes into parallel crystallite slabs whose thickness varies in a non-random manner with depth below the surface. The predicted `apparent' crystallite size is a function of the Bragg angle θ. Qualitative support is given to the theory by the results of x-ray and hardness measurements on lightly abraded nickel.